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1981 | OriginalPaper | Chapter

Data Base

Authors : Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, Charles Fiori, Eric Lifshin

Published in: Scanning Electron Microscopy and X-Ray Microanalysis

Publisher: Springer US

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In order to calculate basic range equations (Chapter 3) and various quantitative x-ray correction schemes (Chapters 7 and 8), the analyst must have at hand the necessary input parameters. This chapter contains various tables (listed below) which include such data as atomic number, atomic weight, density, common oxides (atomic and weight fraction), mass absorption coefficients, and characteristic x-ray line energies. Also included are the J, ω, and R factors for quantitative ZAF corrections. To aid in the selection of coating materials, a compilation of important properties of selected elements is included.

Metadata
Title
Data Base
Authors
Joseph I. Goldstein
Dale E. Newbury
Patrick Echlin
David C. Joy
Charles Fiori
Eric Lifshin
Copyright Year
1981
Publisher
Springer US
DOI
https://doi.org/10.1007/978-1-4613-3273-2_14

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