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Published in:
2014 | OriginalPaper | Chapter
Defect Detection in Fabrics Using Local Binary Patterns
Authors : Pengfei Li, Xuan Lin, Junfeng Jing, Lei Zhang
Published in: Advances in Image and Graphics Technologies
Publisher: Springer Berlin Heidelberg
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To detect defects in fabrics more efficiently, easily and accurately, a method based on Local Binary Pattern (LBP) is proposed in this paper. The main purpose of this algorithm is to extract the feature value of fabric images. Firstly the feature of the whole defect-free fabric image is got with LBP algorithm. Then the image is divided into small detection windows, and the feature of each window can be obtained. Compare their similarity calculated by Chi-square function to get the threshold. Then process the defective images according to the same procedure. At last compare the similarity with the threshold to obtain defect regions. The defects are detected at the same time. Experimental results demonstrate that, LBP algorithm is effective in the area of detecting defects of fabrics.