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2018 | OriginalPaper | Chapter

Design of Heterogeneous Evaluation Method for Redundant Circuits

Authors : Huicong Wu, Jie Yu, Yangang Wang, Xiaoguang Wang

Published in: Smart Computing and Communication

Publisher: Springer International Publishing

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Abstract

Fault-tolerant mechanisms have been an essential part of the electronic equipment in extreme environments such as high voltage, extreme temperature and strong electromagnetic environment etc. Accordingly, how to improve the robustness and disturbance rejection performance of the circuit has become the primary problem in recent years. In this paper, a heterogeneous evaluation method based on relational analysis is proposed. It uses genetic algorithm and evolutionary hardware to get the required sub-circuit structures and uses relational strategy to evaluate heterogeneous degree of redundant circuit system. Finally, the sub-structures with large heterogeneous degree are selected to build redundant circuit system. In the experiments, we designed short-circuit fault and parameter drift fault to validate the heterogeneous evaluation method. The experimental results show this method can not only enhance the heterogeneous degree, but also maintain high robustness. Compared with random heterogeneous redundant system and homogeneous redundant system, the Average Fault-free Probability of redundant fault-tolerant circuit system based on relational method is 8.9% and 21.7% higher respectively in short-circuit fault experiments, and it is 9.1% and 23.9% higher respectively in parameter drift fault experiments.

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Literature
1.
go back to reference Liu, S.F., Cai, H., Yang, Y.J.: Advance in grey incidence analysis modelling. Syst. Eng. Theory Pract. 33(8), 2041–2046 (2013) Liu, S.F., Cai, H., Yang, Y.J.: Advance in grey incidence analysis modelling. Syst. Eng. Theory Pract. 33(8), 2041–2046 (2013)
2.
go back to reference Liu, Z., Dang, Y.G., Zhou, W.J.: New grey nearness incidence model and its extension. Control. Decis. 29(6), 1071–1075 (2014)MATH Liu, Z., Dang, Y.G., Zhou, W.J.: New grey nearness incidence model and its extension. Control. Decis. 29(6), 1071–1075 (2014)MATH
3.
go back to reference Chen, Y.M., Zhang, M.: Cubic spline based grey absolute relational grade model. Syst. Eng. Theory Pract. 35(5), 1304–1310 (2015) Chen, Y.M., Zhang, M.: Cubic spline based grey absolute relational grade model. Syst. Eng. Theory Pract. 35(5), 1304–1310 (2015)
4.
go back to reference Jiang, S.Q., Liu, S.F., Liu, Z.X.: Grey incidence decision making model based on area. Control Decis. 30(4), 685–690 (2015) Jiang, S.Q., Liu, S.F., Liu, Z.X.: Grey incidence decision making model based on area. Control Decis. 30(4), 685–690 (2015)
5.
go back to reference Zhang, M., He, J.: Vector analysis on the fault-tolerant abilities of combined analog circuit systems. In: proceeding of International Congress on Image and Signal Processing, Biomedical Engineering and Informatics, pp. 2020–2025 (2017) Zhang, M., He, J.: Vector analysis on the fault-tolerant abilities of combined analog circuit systems. In: proceeding of International Congress on Image and Signal Processing, Biomedical Engineering and Informatics, pp. 2020–2025 (2017)
6.
go back to reference Chang, H., He, J.: A novel fault-tolerance design model for automatic synthesis of circuit robust to unknown fault. In: Proceeding of Conference Anthology, pp. 1–6. IEEE (2014) Chang, H., He, J.: A novel fault-tolerance design model for automatic synthesis of circuit robust to unknown fault. In: Proceeding of Conference Anthology, pp. 1–6. IEEE (2014)
7.
go back to reference Chang, H., He, J.: Swarm intelligence: making differences in analogue circuits structure for fault-tolerance. Int. J. Comput. Appl. Technol. 46(3), 210–219 (2013)CrossRef Chang, H., He, J.: Swarm intelligence: making differences in analogue circuits structure for fault-tolerance. Int. J. Comput. Appl. Technol. 46(3), 210–219 (2013)CrossRef
8.
go back to reference Zheng, Y., He, J.: Learning the distance between circuit structures for fault tolerance of redundant system. In: proceeding of Seventh International Symposium on Computational Intelligence and Design, pp. 207–211 (2015) Zheng, Y., He, J.: Learning the distance between circuit structures for fault tolerance of redundant system. In: proceeding of Seventh International Symposium on Computational Intelligence and Design, pp. 207–211 (2015)
9.
go back to reference Chen, Z., Ni, M.: Reliability and security analysis of triple-module redundancy system. Comput. Eng. 38(14), 239–241 (2012) Chen, Z., Ni, M.: Reliability and security analysis of triple-module redundancy system. Comput. Eng. 38(14), 239–241 (2012)
10.
go back to reference Gao, G.J., Wang, Y.R., Yao, R.: Research on redundancy and tolerance of system with different structures. Transducer Microsyst. Technol. 26(10), 25–28 (2007) Gao, G.J., Wang, Y.R., Yao, R.: Research on redundancy and tolerance of system with different structures. Transducer Microsyst. Technol. 26(10), 25–28 (2007)
11.
go back to reference Shi, W., Yuan, L., Xie, S.J.: Research on selective redundancy of evolved circuits using negative correlation. Microelectron Comput. 30(6), 71–74 (2013) Shi, W., Yuan, L., Xie, S.J.: Research on selective redundancy of evolved circuits using negative correlation. Microelectron Comput. 30(6), 71–74 (2013)
12.
go back to reference Wu, H.C., Wang, J.Z., Liu, C.C.: Research of circuit evolution design based on adaptive HereBoy algorithm. J. Hebei Univ. Sci. Technol. 36(3), 293–299 (2015) Wu, H.C., Wang, J.Z., Liu, C.C.: Research of circuit evolution design based on adaptive HereBoy algorithm. J. Hebei Univ. Sci. Technol. 36(3), 293–299 (2015)
13.
go back to reference Liu, M., He, J.: An evolutionary negative-correlation framework for robust analog-circuit design under uncertain faults. IEEE Trans. Evol. Comput. 17(5), 640–665 (2013)CrossRef Liu, M., He, J.: An evolutionary negative-correlation framework for robust analog-circuit design under uncertain faults. IEEE Trans. Evol. Comput. 17(5), 640–665 (2013)CrossRef
14.
go back to reference Wu, H.C., Wang, J.Z., Zhou, W.Z.: Redundancy fault-tolerant circuit design based on feature map clustering and heterogeneous selection strategy. High Volt. Eng. 43(4), 1362–1369 (2017) Wu, H.C., Wang, J.Z., Zhou, W.Z.: Redundancy fault-tolerant circuit design based on feature map clustering and heterogeneous selection strategy. High Volt. Eng. 43(4), 1362–1369 (2017)
15.
go back to reference Zhang, J.B., Cai, J.Y., Meng, Y.F.: A design technology of fault tolerance circuit systems facing complex electromagnetic environments. J. Xi’an Jiaotong Univ. 51(2), 53–59 (2017) Zhang, J.B., Cai, J.Y., Meng, Y.F.: A design technology of fault tolerance circuit systems facing complex electromagnetic environments. J. Xi’an Jiaotong Univ. 51(2), 53–59 (2017)
Metadata
Title
Design of Heterogeneous Evaluation Method for Redundant Circuits
Authors
Huicong Wu
Jie Yu
Yangang Wang
Xiaoguang Wang
Copyright Year
2018
DOI
https://doi.org/10.1007/978-3-030-05755-8_40

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