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Published in: Journal of Nondestructive Evaluation 4/2019

01-12-2019

Detecting Phase-Type Defects of Transparent Samples Using Infrared Phase-Shifting Shearing Interferometer

Authors: Shyh-Tsong Lin, Xuan-Hung Trinh, Hong-Hai Hoang

Published in: Journal of Nondestructive Evaluation | Issue 4/2019

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Abstract

A shearing interferometer based on the use of a low-coherence short-wave infrared source, two Savart shear devices, and the phase-shifting technique is proposed in this research. It is free of speckle-noise and robust to environmental perturbations, and it is capable to identify phase-type defects in the inspected sample using a gradient image obtained by the phase-shifting technique. This paper introduces the configuration, measurement theory, experimental setup, and experimental results of the proposed interferometer. The results confirm the capability of defect detections of the proposed interferometer.

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Metadata
Title
Detecting Phase-Type Defects of Transparent Samples Using Infrared Phase-Shifting Shearing Interferometer
Authors
Shyh-Tsong Lin
Xuan-Hung Trinh
Hong-Hai Hoang
Publication date
01-12-2019
Publisher
Springer US
Published in
Journal of Nondestructive Evaluation / Issue 4/2019
Print ISSN: 0195-9298
Electronic ISSN: 1573-4862
DOI
https://doi.org/10.1007/s10921-019-0637-y

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