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Published in:
2011 | OriginalPaper | Chapter
4. Diffraction from Polycrystalline Samples and Determination of Crystal Structure
Authors : Professor Dr. Yoshio Waseda, Professor Dr. Eiichiro Matsubara, Professor Kozo Shinoda
Published in: X-Ray Diffraction Crystallography
Publisher: Springer Berlin Heidelberg
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Abstract
There are various methods for measuring the intensity of a scattered X-ray beam (hereafter referred to as diffracted X-ray beam in this chapter) from crystalline materials, and each method has the respective advantage. The most common method is to measure the X-ray diffraction intensity from a powder sample as a function of scattering angle (it is also called diffraction angle) by using a diffractometer. For this reason, several key points of structural analysis will be given with some selected examples on how to obtain structural information of powder samples of interest from measured intensity data using a diffractometer.