Domain-informed Machine Learning for Smart Manufacturing
- 2025
- Book
- Author
- Qiang Huang
- Publisher
- Springer Nature Switzerland
About this book
This book introduces the state-of-the-art understanding on domain-informed machine learning (DIML) for advanced manufacturing. Methods and case studies presented in this volume show how complicated engineering phenomena and mechanisms are integrated into machine learning problem formulation and methodology development. Ultimately, these methodologies contribute to quality control for smart personalized manufacturing. The topics include domain-informed feature representation, dimension reduction for personalized manufacturing, fabrication-aware modeling of additive manufacturing processes, small-sample machine learning for 3D printing quality, optimal compensation of 3D shape deviation in 3D printing, engineering-informed transfer learning for smart manufacturing, and domain-informed predictive modeling for nanomanufacturing quality. Demonstrating systematically how the various aspects of domain-informed machine learning methods are developed for advanced manufacturing such as additive manufacturing and nanomanufacturing, the book is ideal for researchers, professionals, and students in manufacturing and related engineering fields.
Table of Contents
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Frontmatter
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Chapter 1. Introduction to Smart Manufacturing and Its Quality Control
Qiang HuangAbstractSmart manufacturing refers to the next-generation manufacturing featured by “fully-integrated, collaborative manufacturing systems that respond in real time to meet changing demands and conditions in the factory, in the supply network, and in customer needs” (NIST, National Institute of Standards and Technology). -
Fabrication-Aware Machine Learning for Additive Manufacturing: Two-Dimensional Shape Quality Representation, Learning, and Prediction
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Frontmatter
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Chapter 2. Representation of Two-Dimensional (2D) Geometric Shape Quality
Qiang HuangAbstractProduct geometric quality is critical to product functionality and proper fit. In AM, the post-production measurement of product accuracy is often conducted through 3D scanning using structured light scanning or laser scanning. A cloud of points will be generated by the 3D scanner to digitally replicate the scanned object or manufactured part. Embedded in the Euclidean space, each point has its set of Cartesian coordinates measuring a point on the exterior surface or boundary of an object. Depending on the sensing and scanning techniques, each point may also contain RGB color data or intensity information. Point clouds have been widely used in many engineering and medical disciplines such as computer-aided design, reverse engineering, metrology and quality inspection, architecture modeling, geographic information systems, augmented reality, and medical imaging. -
Chapter 3. Small-Sample Learning and Prediction of 2D Geometric Shape Quality
Qiang HuangAbstractLearning and prediction of geometric quality in AM aims to learn and predict geometric shape deviations of both built and untried product shapes based on a small set of training products. To effectively control shape deviations of new and untried product shapes in AM, we classify the modeling approaches as predicting modeling and prescriptive modeling. While traditional predictive modeling usual makes prediction within its experimental domains, e.g., a class or family of products, prescriptive modeling is able to make prediction of quality of new and untried categories of shapes beyond the experimental scope. This chapter will first introduce predictive modeling approach to predict geometric quality for products with simply 2D geometries. The modeling approach is further extended and generalized for prescriptive small-sample modeling and prediction for 2D freeform products.
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Fabrication-Aware Machine Learning for Additive Manufacturing: Three-Dimensional Shape Quality Learning and Prediction
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Frontmatter
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Chapter 4. Representation of Three-Dimensional (3D) Geometric Quality
Qiang HuangAbstractThe final product geometries in AM are often deformed or distorted. The deviations of three-dimensional (3D) shapes from their intended designs can be represented as 2D surfaces in a \(\mathbb {R}^3\) space, which constitutes a complicated set of data for representing, learning, and predicting geometric quality. Patterns of deviation surfaces vary with shape geometries, sizes/volumes, materials, and AM processes. -
Chapter 5. Small-Sample Learning and Prediction of 3D Geometric Quality
Qiang HuangAbstractThree-dimensional (3D) shape accuracy is a critical performance measure for products built via AM. With advances in computing and increased accessibility of AM product data, machine learning for AM (ML4AM) has become a viable strategy for enhancing AM. Proper description of the 3D shape formation through the layer-by-layer fabrication process is critical to incorporate process domain knowledge into ML4AM. The physics-based modeling and simulation approaches present voxel-level description of an object formation from points to lines, lines to surfaces, and surfaces to 3D shapes. However, this computationally intensive modeling framework does not provide a clear structure for machine learning of AM data. Chapter 5 introduces domain-informed small-sample learning and prediction of shape accuracy of 3D objects.
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Process-Informed Optimal Compensation for Additive Manufacturing Quality Control
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Frontmatter
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Chapter 6. Foundation of Offline Optimal Compensation of 3D Shape Deviation
Qiang HuangAbstractWhile predicting shape deviation belongs to the forward problem, minimizing shape deviation of AM-built products is a challenging inverse problem due to geometric complexity, product varieties, material phase changing and shrinkage, interlayer bonding, and limited sample data. Various methods and strategies have been developed to improve geometric quality of AM processes. We summarize the related work in Table 6.1 with a sample literature given for each category.Table 6.1Geometric quality control methods in additive manufacturingMethod and strategySample literature1.Simulation study based on the first principles[15, 18, 21]2.Offline optimization of process settings through experimentation[20, 28, 32]3.Machine calibration through building test parts[14, 23, 24, 28, 29, 32]4.Part geometry calibration through extensive trial build[6]5.Adjustment of product design and process planning[3, 10, 11, 14, 16, 17, 23, 24, 30, 31]6.Feedback control and online monitoring[4, 5, 7, 8, 12, 19, 22] -
Chapter 7. Applications of Process-Informed Optimal Compensation
Qiang HuangAbstractThis chapter introduces applications of the optimal compensation method and algorithm to reduce the shape deviation in metal AM process and to statistically monitor the part-to-part changes in AM.
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Domain-Informed Transfer Learning and Automated Model Generation for Smart Manufacturing
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Frontmatter
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Chapter 8. Transfer Learning Via Effect Equivalence in AM Systems
Qiang HuangAbstractRecent advances in the industrial Internet of Things and Cyber–Physical Systems have resulted in greater connections and accessibility of smart manufacturing. A particularly exciting consequence is the development of a new paradigm of smart AM systems that seamlessly integrate computing, manufacturing, and services. Each individual AM or 3D printing machine in such a system enables direct manufacturing of complex shapes from CAD models with reduced labor and costs compared to traditional manufacturing methods. The impacts of such systems are not yet fully realized in practice because their constituent processes may yield inconsistent product quality. Furthermore, Individual processes and machines face varying degrees of insufficient data and physical knowledge. A specified process model through machine learning often has a limited scope of application across the vast spectrum of processes in a manufacturing system that are characterized by different settings of process variables, including lurking variables. Knowledge or model transfer among AM processes is therefore essential to smart AM systems. -
Chapter 9. Automated Model Generation Via Principled Design of Neural Networks for AM Systems
Qiang HuangAbstractA significant challenge in quality control of an AM system is the model specification for different computer-aided design products manufactured by constituent AM processes. Current machine learning techniques can require substantial user inputs and efforts to implement in practice.
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Domain-Informed Machine Learning for Nanomanufacturing of Nanostructures
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Frontmatter
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Chapter 10. Scale-Up Modeling for Nanomanufacturing
Qiang HuangAbstractNanomanufacturing represents the future of US manufacturing. Nanostructured materials and processes have been estimated to increase their market impact to about $340 billion per year in the next 10 years. In the past decade, tremendous efforts have been devoted to basic nanoscience discovery, novel process development, and concept proof of nano devices. Yet much less research activities have been undertaken in nanomanufacturing to duplicate the success of transforming quality and productivity performance of traditional manufacturing. High cost of processing has been a major barrier of transferring the fast-developing nanotechnology from laboratories to industry applications. The process yield of current nano devices is typically 10% or less. Hence, there is an imperative need of process improvement methodologies for nanomanufacturing. -
Chapter 11. Domain-Informed Bayesian Hierarchical Modeling of Nanowire Growth at Multiple Scales
Qiang HuangAbstractThis chapter introduces domain-informed modeling of nanowire (NW) growth process at multiple scales of interest for prediction. The main idea is to integrate available data and physical knowledge through a Bayesian hierarchical framework with consideration of scale effects. At each scale, the NW growth model describes the time-space evolution of NWs across different sites on a substrate. The model consists of two major components: NW morphology and local variability. The morphology component represents the overall trend characterized by growth kinetics. The area-specific variability is less understood in nanophysics due to complex interactions among neighboring NWs. The local variability is therefore modeled by an intrinsic Gaussian Markov random field (IGMRF) so as to separate itself from the growth kinetics in the morphology component. Case studies are provided to illustrate the NW growth process model at the coarse and fine scales, respectively. -
Chapter 12. Cross-Domain Model Building and Validation for Nanomanufacturing Processes
Qiang HuangAbstractUnderstanding the nanostructure growth faces issues of limited data, lack of physical knowledge, and large process uncertainties. These issues result in modeling difficulty because a large pool of candidate models almost fit the data equally well. Through the domain-informed machine learning strategy, we derive the process models from physical and statistical domains, respectively, and reinforce the understanding of growth processes by identifying the common model structure across two domains. This cross-domain model building strategy essentially validates models by domain knowledge rather than by (unavailable) data. It not only increases modeling confidence under large uncertainties, but also enables insightful physical understanding of the growth kinetics. We present this method by studying the weight growth kinetics of silica nanowire under two temperature conditions. The derived nanowire growth model is able to provide physical insights for prediction and control under uncertainties. -
Chapter 13. Physical–Statistical Modeling of Graphene Growth Processes
Qiang HuangAbstractAs a zero-band semiconductor, graphene is an attractive material for a wide variety of applications such as optoelectronics. Among various techniques developed for graphene synthesis, chemical vapor deposition (CVD) on copper foils shows high potential for producing few-layer and large-area graphene. Since fabrication of high-quality graphene sheets requires the understanding of growth mechanisms, and methods of characterization and control of grain size of graphene flakes, analytical modeling of graphene growth process is therefore essential to controlled fabrication. The graphene growth process starts with randomly nucleated islands that gradually develop into complex shapes, grow in size, and eventually connect together to cover the copper foil. To model this complex process, this chapter introduces a physical–statistical approach under the assumption of self-similarity during graphene growth. The growth kinetics is uncovered by separating island shapes from area growth rate. -
Chapter 14. Stochastic Modeling of Graphene Growth Kinetics
Qiang HuangAbstractGraphene is an emerging nanomaterial for a wide variety of novel applications. Controlled synthesis of high-quality graphene sheets requires analytical understanding of graphene growth kinetics. The graphene growth via chemical vapor deposition starts with randomly nucleated islands that gradually develop into complex shapes, grow in size, and eventually connect together to form a graphene sheet. Models proposed for this stochastic process do not, in general, permit assessment of uncertainty. This chapter introduces a stochastic modeling framework for the growth process and Bayesian inferential models. The modeling approach accounts for the data collection mechanism and allows for uncertainty analyses, for learning about the kinetics from experimental data. Furthermore, we link the growth kinetics with controllable experimental factors, thus providing a framework for statistical design and analysis of future experiments.
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Domain-Informed Nanostructure Characterization and Defection Detection in Nanomanufacturing
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Chapter 15. Learning Interactions Among Nanostructures for Characterization and Defect Detection
Qiang HuangAbstractSince properties of nanomaterials are determined by their structures, characterizing nanostructure feature variability and diagnosing structure defects are of great importance for quality control in scale-up nanomanufacturing. It is known that nanostructure interactions such as competing for source materials during growth contribute strongly to nanostructure uniformity and defect formation. However, there is a lack of rigorous formulation to describe nanostructure interactions and their effects on nanostructure variability. This chapter introduces a method to relate local nanostructure variability (quality measure) to nanostructure interactions under the framework of Gaussian Markov random field. With the developed modeling and estimation approaches, we are able to extract nanostructure interactions for any local region with or without defects based on its feature measurement. The established connection between nanostructure variability and interactions not only provides a metric for assessing nanostructure quality but also enables a method to automatically detect defects and identify their patterns based on the underlying interaction patterns. Both simulation and real case studies are conducted to demonstrate the developed methods. The insights obtained from real case study agree with physical understanding. -
Chapter 16. Characterization of Nanostructure Interactions with Incomplete Feature Measurement
Qiang HuangAbstractNanostructure interactions contribute strongly to structure uniformity and defect formation. Characterizing the interaction not only assists to understand the growth kinetics but also provides a metric to benchmark growth quality. Chapter 15 presented interaction modeling and estimation methods for one local region, which assume complete feature measurement. In order to map interaction patterns across the whole substrate, direct application of the methods would require complete information of a specimen. This implies a formidable metrology task using current inspection techniques such as scanning electron microscopy (SEM). In this chapter, we relax the metrology constraint and analyze nanostructure interactions with incomplete feature measurement. Specifically, we optimize Expectation-Maximization (EM) algorithm based on Markovian properties of interaction modeling and develop a tailored space filling design to select which sites to measure.
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Backmatter
- Title
- Domain-informed Machine Learning for Smart Manufacturing
- Author
-
Qiang Huang
- Copyright Year
- 2025
- Publisher
- Springer Nature Switzerland
- Electronic ISBN
- 978-3-031-91631-1
- Print ISBN
- 978-3-031-91630-4
- DOI
- https://doi.org/10.1007/978-3-031-91631-1
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