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23-08-2024

Dual injection enhanced super junction TIGBT with narrow mesa and floating-P region

Authors: Jinping Zhang, Mengxiao Li, Yunxiang Huang, Bing Xiao, Bo Zhang

Published in: Journal of Computational Electronics | Issue 6/2024

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Abstract

For the conventional super junction trench insulated gate bipolar transistor (SJ-TIGBT), the higher the N/P column doping concentration (Nc), the better the electrical characteristics can be obtained. However, considering the negative impact of charge imbalance of the N/P column on the breakdown voltage (BV), the value of Nc is limited, which limits the improvement of device performances. In this paper, a novel SJ-TIGBT with narrow mesa (NM) and floating-P (FP) region (NMFP-SJ-TIGBT) is proposed. The electrical characteristics of the proposed SJ-TIGBT are significantly enhanced owing to the dual injection enhancement effect provided by the NM and FP region. Moreover, for the proposed SJ device, the excellent performance obtained in the lower Nc regime alleviates the negative impact of charge imbalance of N/P column on the BV, which greatly improves its fabrication process tolerance. The simulation results show that compared to the conventional SJ-TIGBT (SJ-TIGBT-A), a SJ-TIGBT with an n-injector layer (SJ-TIGBT-B) and a SJ-TIGBT with a floating-P column under the gate (SJ-TIGBT-C), the proposed structure demonstrates a significantly lower and almost constant on-state voltage drop (Vceon). At a collector current density of 100 A/cm2 and Nc of 1 × 1015 cm−3, the Vceon of the proposed SJ-TIGBT is 74.9%, 41.1% and 26.1% lower than that of the SJ-TIGBT-A, SJ-TIGBT-B and SJ-TIGBT-C, respectively. With the same Vceon of 1.05 V and Nc of 1 × 1015 cm−3, the turn-off loss of the proposed SJ-TIGBT is only 6.44 mJ/cm2, which is 73.7% and 35.4% lower than that of SJ-TIGBT-B and SJ-TIGBT-C, respectively.

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Metadata
Title
Dual injection enhanced super junction TIGBT with narrow mesa and floating-P region
Authors
Jinping Zhang
Mengxiao Li
Yunxiang Huang
Bing Xiao
Bo Zhang
Publication date
23-08-2024
Publisher
Springer US
Published in
Journal of Computational Electronics / Issue 6/2024
Print ISSN: 1569-8025
Electronic ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-024-02218-w