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Journal of Electronic Testing
Published in: Journal of Electronic Testing 1/2022

14-03-2022

Editorial

Author: Vishwani D. Agrawal

Published in: Journal of Electronic Testing | Issue 1/2022

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Excerpt

We begin 2022 by welcoming two new editors to the Editorial Board of JETTA. Professor Jie Han is with the Department of Electrical and Computer Engineering at the University of Alberta in Canada. His areas of expertise include approximate computing, stochastic computing, brain-inspired learning systems and neural networks, reliability, fault tolerance, nanoelectronics, and novel computational models for nanoscale and biological applications. Dr. Albin Yan is with the School of Computer Science and Technology, Anhui University (AHU), China, where he is the Director of the AHU Institute of Chip Design and Test. His expertise also includes soft error mitigation techniques. The biographies of Professors Jie Han and Albin Yan appear in this issue following this editorial. …
next article New Editors – 2022

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Metadata
Title
Editorial
Author
Vishwani D. Agrawal
Publication date
14-03-2022
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 1/2022
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-022-05995-z

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