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Journal of Electronic Testing
Published in: Journal of Electronic Testing 2/2013

01-04-2013

Editorial

Author: Vishwani D. Agrawal

Published in: Journal of Electronic Testing | Issue 2/2013

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Excerpt

This is a special issue based on the First Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN 2012), Annecy, France, held on June 1, 2012. The plan for a special issue was announced at the workshop. Four papers selected from the submitted set of papers appear here. I am thankful to Guest Editors, Dimitris Gizopoulos, Said Hamdioui and Hans Manhaeve for carrying out the journal’s peer review process. They introduce the papers in a guest editorial that follows the TTTC Newsletter. The second workshop in this series, MEDIAN 2013, will be held in Avignon, France, May 30-31, 2013. You can find out more from http://​www.​median-project.​eu/​median2013.​htm. …
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Metadata
Title
Editorial
Author
Vishwani D. Agrawal
Publication date
01-04-2013
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 2/2013
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-013-5378-8

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