Skip to main content
Disciplines
Automotive Business IT + Informatics Construction + Real Estate Electrical Engineering + Electronics Energy + Sustainability Insurance + Risk Finance + Banking Management + Leadership Marketing + Sales Mechanical Engineering + Materials
Events
DE
EN
Books
Journals
Topic Page
Marketing
Start single access now
Access for companies
EXTENDED SEARCH
Log in
Top
Semiconductors
Published in: Semiconductors 6/2015

01-06-2015 | Proceedings of the Conference “Silicon-2014”, Irkutsk, July 7–12, 2014

Effect of copper on the recombination activity of extended defects in silicon

Authors: O. V. Feklisova, E. B. Yakimov

Published in: Semiconductors | Issue 6/2015

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …
previous article Interstitial carbon formation in irradiated copper-doped silicon
next article EBIC and LBIC studies of the properties of extended defects in plastically deformed silicon

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

inform now
Metadata
Title
Effect of copper on the recombination activity of extended defects in silicon
Authors
O. V. Feklisova
E. B. Yakimov
Publication date
01-06-2015
Publisher
Pleiades Publishing
Published in
Semiconductors / Issue 6/2015
Print ISSN: 1063-7826
Electronic ISSN: 1090-6479
DOI
https://doi.org/10.1134/S106378261506010X

Other articles of this Issue 6/2015

Semiconductors 6/2015 Go to the issue

Proceedings of the Conference “Silicon-2014”, Irkutsk, July 7–12, 2014

Quantitative description of the properties of extended defects in silicon by means of electron- and laser-beam-induced currents

Proceedings of the Conference “Silicon-2014”, Irkutsk, July 7–12, 2014

Low-temperature conductivity of silicon doped with antimony

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Edge effects in second-harmonic generation in nanoscale layers of transition-metal dichalcogenides

Semiconductor Structures, Low-Dimensional Systems, and Quantum Phenomena

Wannier-Mott excitons in semiconductors with a superlattice

Proceedings of the Conference “Silicon-2014”, Irkutsk, July 7–12, 2014

Interstitial carbon formation in irradiated copper-doped silicon

Proceedings of the Conference “Silicon-2014”, Irkutsk, July 7–12, 2014

EBIC and LBIC studies of the properties of extended defects in plastically deformed silicon

Premium Partner

    Image Credits