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Published in: Journal of Materials Science: Materials in Electronics 21/2019

30-09-2019

Effect of nano-ZnO particles on wettability, interfacial morphology and growth kinetics of Sn–3.0Ag–0.5Cu–xZnO composite solder

Authors: Min Qu, Tianze Cao, Yan Cui, Fengbin Liu, Zhiwei Jiao

Published in: Journal of Materials Science: Materials in Electronics | Issue 21/2019

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Abstract

The influence of nano-ZnO particles addition on wettability, thermal behavior and interface morphology of Sn–3.0Ag–0.5Cu (SAC305) lead-free solder were investigated in present study. SAC305-xZnO composite solder with five different mass fractions of nano-ZnO particles ranging from 0 to 2.0 wt% were synthesized with SAC305 powder, nano-ZnO particles and flux. Solder joints were soldered in a reflow furnace with the maximum temperature of 255 °C for 7 min and followed by isothermal aging at 170 °C up to 240 h. The results reveal that the wettability improves first and then reduces whereas the thickness of intermetallic compounds (IMCs) layer declines first and then increases with the amount of nano-ZnO particles increasing where the threshold occurs at 0.5 wt% nano-ZnO particles, meaning slight addition of nano-ZnO particles can effectively improve wettability as well as restrain IMCs layer growth. The thermal behaviors of SAC305-xZnO composite solder increases slightly as nano-ZnO particles adds from 0 to 2.0 wt%. Moreover, the diffusion coefficient of solder is 0.92 μm2/h, 0.21 μm2/h, 0.22 μm2/h, 0.37 μm2/h and 0.48 μm2/h in sequence with nano-ZnO particles increased from 0 to 2.0 wt%, revealing nano-ZnO particles can inhibit atoms diffusion so as to suppress IMCs layer. Furthermore, the grain size of Cu6Sn5 is observed that it increases with power function of aging time describing as \(d = 1.70t^{0.38}\). In the end, it reveals that Cu6Sn5 grows both longitudinally controlled by volume diffusion as well as transversely in the form of boundary diffusion.

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Literature
1.
go back to reference S.F. Cheng, C.M. Huang, M. Pecht, Microelectron. Reliab. 75, 77–95 (2017)CrossRef S.F. Cheng, C.M. Huang, M. Pecht, Microelectron. Reliab. 75, 77–95 (2017)CrossRef
2.
go back to reference M.I.I. Ramli, N. Saud, M.A.A.M. Salleh, M.N. Derman, R.M. Said, Microelectron. Reliab. 65, 255–264 (2016)CrossRef M.I.I. Ramli, N. Saud, M.A.A.M. Salleh, M.N. Derman, R.M. Said, Microelectron. Reliab. 65, 255–264 (2016)CrossRef
4.
go back to reference X.W. Hu, Q. Huang, Y.L. Li, Y. Liu, Z.X. Min, J. Mater. Sci.: Mater. Electron. 26, 5140–5151 (2015) X.W. Hu, Q. Huang, Y.L. Li, Y. Liu, Z.X. Min, J. Mater. Sci.: Mater. Electron. 26, 5140–5151 (2015)
6.
7.
8.
go back to reference Y.C.L.X. Wang, C. Wei, H.X. Gao, P. Jiang, L.M. Yu, J. Alloys Compds. 476, 662–665 (2009)CrossRef Y.C.L.X. Wang, C. Wei, H.X. Gao, P. Jiang, L.M. Yu, J. Alloys Compds. 476, 662–665 (2009)CrossRef
9.
go back to reference M.A. Wadud, M.A. Gafur, M.R. Qadir, M.O. Rahman, Mater. Sci. Appl. 6, 1008–1013 (2015) M.A. Wadud, M.A. Gafur, M.R. Qadir, M.O. Rahman, Mater. Sci. Appl. 6, 1008–1013 (2015)
10.
go back to reference F. Xing, J. Yao, J.W. Liang, X.M. Qiu, J. Alloys Compds. 649, 1053–1059 (2015)CrossRef F. Xing, J. Yao, J.W. Liang, X.M. Qiu, J. Alloys Compds. 649, 1053–1059 (2015)CrossRef
11.
go back to reference E. Çadırlı, U. Böyük, H. Kaya, N. Maraşlı, J. Non-Cryst Solids 357, 2876–2881 (2011)CrossRef E. Çadırlı, U. Böyük, H. Kaya, N. Maraşlı, J. Non-Cryst Solids 357, 2876–2881 (2011)CrossRef
12.
13.
14.
go back to reference A.A. El-Daly, W.M. Desoky, T.A. Elmosalami, M.G. El-Shaarawy, A.M. Abdraboh, Mater. Des. 65, 1196–1204 (2015)CrossRef A.A. El-Daly, W.M. Desoky, T.A. Elmosalami, M.G. El-Shaarawy, A.M. Abdraboh, Mater. Des. 65, 1196–1204 (2015)CrossRef
15.
16.
go back to reference Q.K. Zhang, W.M. Long, X.Q. Yu, Y.Y. Pei, P.X. Qiao, J. Alloys Compds. 622, 973–978 (2015)CrossRef Q.K. Zhang, W.M. Long, X.Q. Yu, Y.Y. Pei, P.X. Qiao, J. Alloys Compds. 622, 973–978 (2015)CrossRef
17.
go back to reference B.L. Silva, N. Cheung, A. Garcia, J.E. Spinelli, Mater. Lett. 142, 163–167 (2015)CrossRef B.L. Silva, N. Cheung, A. Garcia, J.E. Spinelli, Mater. Lett. 142, 163–167 (2015)CrossRef
18.
go back to reference J. Chen, J. Shen, W.D. Xie, H. Liu, J. Mater. Sci.: Mater. Electron. 22, 1703–1708 (2011) J. Chen, J. Shen, W.D. Xie, H. Liu, J. Mater. Sci.: Mater. Electron. 22, 1703–1708 (2011)
19.
go back to reference B. Li, Y.W. Shi, Y.P. Lei, F. Guo, Z.D. Xia, B. Zong, J. Electron. Mater. 34, 217–224 (2005)CrossRef B. Li, Y.W. Shi, Y.P. Lei, F. Guo, Z.D. Xia, B. Zong, J. Electron. Mater. 34, 217–224 (2005)CrossRef
20.
go back to reference M.A.A. Mohd Salleh, S.D. McDonald, C.M. Gourlay, H. Yasuda, K. Nogita, Mater. Des. 108, 418–428 (2016)CrossRef M.A.A. Mohd Salleh, S.D. McDonald, C.M. Gourlay, H. Yasuda, K. Nogita, Mater. Des. 108, 418–428 (2016)CrossRef
21.
go back to reference Y. Tang, S.M. Luo, K.Q. Wang, G.Y. Li, J. Alloys Compds. 684, 299–309 (2016)CrossRef Y. Tang, S.M. Luo, K.Q. Wang, G.Y. Li, J. Alloys Compds. 684, 299–309 (2016)CrossRef
22.
23.
go back to reference W.Q. Xing, X.Y. Yu, H. Li, L. Ma, W. Zuo, P. Dong, W.X. Wang, M. Ding, Mater. Sci. Eng. A 678, 252–259 (2016)CrossRef W.Q. Xing, X.Y. Yu, H. Li, L. Ma, W. Zuo, P. Dong, W.X. Wang, M. Ding, Mater. Sci. Eng. A 678, 252–259 (2016)CrossRef
24.
go back to reference Z. Zhang, X.W. Hu, X.X. Jiang, Y.L. Li, Metall. Mater. Trans. A 50, 480–492 (2019)CrossRef Z. Zhang, X.W. Hu, X.X. Jiang, Y.L. Li, Metall. Mater. Trans. A 50, 480–492 (2019)CrossRef
25.
go back to reference K. Suganuma, Lead-Free Soldering (Science Press, Beijing, 2004), p. 70 K. Suganuma, Lead-Free Soldering (Science Press, Beijing, 2004), p. 70
26.
go back to reference A.A. El-Daly, G.S. Al-Ganainy, A. Fawzy, M.J. Younis, Mater. Des. 55, 837–845 (2014)CrossRef A.A. El-Daly, G.S. Al-Ganainy, A. Fawzy, M.J. Younis, Mater. Des. 55, 837–845 (2014)CrossRef
27.
go back to reference Y. Gu, X.C. Zhao, Y. Li, Y. Liu, Y. Wang, Z.Y. Li, J. Alloys Compds. 627, 39–47 (2015)CrossRef Y. Gu, X.C. Zhao, Y. Li, Y. Liu, Y. Wang, Z.Y. Li, J. Alloys Compds. 627, 39–47 (2015)CrossRef
28.
go back to reference H.R. Kotadia, P.D. Howes, S.H. Mannan, Microelectron. Reliab. 54, 1253–1273 (2014)CrossRef H.R. Kotadia, P.D. Howes, S.H. Mannan, Microelectron. Reliab. 54, 1253–1273 (2014)CrossRef
30.
go back to reference G.K. Sujan, A.S.M.A. Haseeb, A.B.M. Afifi, Mater. Charact. 97, 199–209 (2014)CrossRef G.K. Sujan, A.S.M.A. Haseeb, A.B.M. Afifi, Mater. Charact. 97, 199–209 (2014)CrossRef
31.
32.
33.
go back to reference J.J. Yu, C.A. Yang, Y.F. Lin, C.H. Hsueh, C.R. Kao, J. Alloys Compds. 629, 16–21 (2015)CrossRef J.J. Yu, C.A. Yang, Y.F. Lin, C.H. Hsueh, C.R. Kao, J. Alloys Compds. 629, 16–21 (2015)CrossRef
34.
go back to reference H.Y. Chuang, J.J. Yu, M.S. Kuo, H.M. Tong, C.R. Kao, Scr. Mater. 66, 171–174 (2012)CrossRef H.Y. Chuang, J.J. Yu, M.S. Kuo, H.M. Tong, C.R. Kao, Scr. Mater. 66, 171–174 (2012)CrossRef
35.
go back to reference C.K. Chung, Y.J. Chen, W.M. Chen, C.R. Kao, Acta Mater. 60, 4586–4593 (2012)CrossRef C.K. Chung, Y.J. Chen, W.M. Chen, C.R. Kao, Acta Mater. 60, 4586–4593 (2012)CrossRef
38.
go back to reference H.K. Kim, K.N. Tu, J. Phys. Rev. B 53, 593–596 (1996) H.K. Kim, K.N. Tu, J. Phys. Rev. B 53, 593–596 (1996)
39.
go back to reference M. Schaefer, R.A. Founelle, J. Liang, J. Electron. Mater. 27, 1167–1176 (1998)CrossRef M. Schaefer, R.A. Founelle, J. Liang, J. Electron. Mater. 27, 1167–1176 (1998)CrossRef
40.
Metadata
Title
Effect of nano-ZnO particles on wettability, interfacial morphology and growth kinetics of Sn–3.0Ag–0.5Cu–xZnO composite solder
Authors
Min Qu
Tianze Cao
Yan Cui
Fengbin Liu
Zhiwei Jiao
Publication date
30-09-2019
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 21/2019
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-019-02279-9

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