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Journal of Sol-Gel Science and Technology

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01-09-2015 | Original Paper

Effects of seed layer and crystallization process on crystal orientation and properties of NKBT thin films

Published in: Journal of Sol-Gel Science and Technology | Issue 3/2015

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Abstract

Lead-free (Na_0.85K_0.15)_0.5Bi_0.5TiO₃ (NKBT) piezoelectric thin films were fabricated via an aqueous sol–gel method on Pt(111)/Ti/SiO₂/Si substrates. The thin films, with and without Pb_0.8La_0.1Ca_0.1Ti_0.975O₃ seed layer, were obtained by single-crystallization and multiple-crystallization processes. The NKBT thin films derived by multiple-crystallization process exhibited better single perovskite structure, and the films with PLCT seed layers were well crystallized with high (100) orientation. The effects that seed layer and different crystallization processes have on crystal orientation and electrical properties can be attributed to extrinsic and intrinsic contributions, and their different mechanism and ranges of improvement in the dielectricity and piezoelectricity are observed and discussed. The NKBT thin films that prepared by multiple crystallization with PLCT seed layer had the best electric property with ε _r of 598, tanδ of 0.08, and d ₃₃ of 136 pm/V.

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Title: Effects of seed layer and crystallization process on crystal orientation and properties of NKBT thin films
Publication date: 01-09-2015
Published in: Journal of Sol-Gel Science and Technology / Issue 3/2015
Print ISSN: 0928-0707
Electronic ISSN: 1573-4846
DOI: https://doi.org/10.1007/s10971-015-3742-0

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