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2014 | OriginalPaper | Chapter

3. Electrical Noise in Deep-Submicron CMOS

Author : Amir Zjajo

Published in: Stochastic Process Variation in Deep-Submicron CMOS

Publisher: Springer Netherlands

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Abstract

In addition to device variability, which sets the limitations of circuit designs in terms of accuracy, linearity and timing, existence of electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits.

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Metadata
Title
Electrical Noise in Deep-Submicron CMOS
Author
Amir Zjajo
Copyright Year
2014
Publisher
Springer Netherlands
Book
Stochastic Process Variation in Deep-Submicron CMOS

Print ISBN: 978-94-007-7780-4

Electronic ISBN: 978-94-007-7781-1

Copyright Year: 2014

DOI
https://doi.org/10.1007/978-94-007-7781-1_3