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Measurement Principles and Structures Read chapter Read first chapter

2006 | OriginalPaper | Chapter

9. Electrical Properties

Authors : Bernd Schumacher, Dr., Heinz-Gunter Bach, Ph.D., Petra Spitzer, Jan Obrzut, Dr.

Published in: Springer Handbook of Materials Measurement Methods

Publisher: Springer Berlin Heidelberg

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Abstract

Electronic materials – conductors, insulators, semiconductors – play an important role in today's technology. They constitute “electrical and electronic devices”, such as radio, television, telephone, electric light, electromotors, computers, etc. From a materials science point of view, the electrical properties of materials characterize two basic processes: electrical energy conduction (and dissipation) and electrical energy storage.
  • Electrical conductivity describes the ability of a material to transport charge through the process of conduction, normalized by geometry. Electrical dissipation comes as the result of charge transport or conduction. Dissipation or energy loss results from the conversion of electrical energy to thermal energy (Joule heating) through momentum transfer during collisions as the charges move.
  • Electrical storage is the result of charge storing energy. This process is dielectric polarization, normalized by geometry to be the material property called dielectric permittivity. As polarization occurs and causes charges to move, the charge motion is also dissipative.
In this chapter, the main methods to characterize the electrical properties of materials are compiled. Sections 9.2 to 9.5 describe the measuring methods under the following headings:
  • Electrical conductivity of metallic materials
  • Electrolytical conductivity
  • Semiconductors
  • Dielectrics
As an introductory overview, in Sect. 9.1 the basic categories of electrical materials are outlined in adopting the classification and terminology of chapter the “Electronic Properties of Materials” of “Understanding Materials Science” by Hummel [9.1].

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previous chapter Thermal Properties
next chapter Magnetic Properties
Literature
9.1.
R. E. Hummel: Understanding Materials Science, Chap. 11, Electrical Properties of Materials (Springer, New York, Berlin 2004) pp. 185–222
9.2.
C. H. He, Z. Lu, S. Liu, R. Liu: Cross-conductivity standard for non-ferrous metals, IEEE Trans. IM 44, 181–183 (1995)
9.3.
G. Rietveld, C. V. Koijmans, L. C. A. Henderson, M. J. Hall, S. Harmon, P. Warnecke, B. Schumacher: DC conductivity measurements in the van der Pauw geometry, IEEE Trans. IM 52, 449–453 (2003)
9.4.
L. J. van der Pauw: A method of measuring specific resistivity and Hall effect of discs of arbitrary shape, Philips Res. Rep. 13, 1–9 (1958)
9.5.
DIN IEC 468: Method of Measurement of Resistivity of Metallic Materials (Beuth, Berlin 1981)
9.6.
NPL Report DEM-ES 001: Techniques and materials for the measurement of DC and AC conductivity of non-ferrous metals and alloys, Conductivity, May 2004. The Conductivity project is (has been) financially supported by an EU grant (contract no. G6RD-CT-2000-00210) under the EU Growth programme, part of the 5th Framework programme
9.7.
M. J. Hall, L. C. A. Henderson, G. Ashcroft, S. Harmon, P. Warnecke, B. Schumacher, G. Rietveld: Discrepancies between the DC and AC measurement of low frequency electrical conductivity, Dig. Conf. Proc. Electrom. Meas. CPEM 2004, London (2004) pp. 34–35
9.8.
A. C. Lynch, A. E. Drake, C. H. Dix: Measurement of eddy-current conductivity, IEE Proc. Sci. Meas. Technol. 130, 254–260 (1983)
9.9.
H. Kamerlingh Onnes: The superconductivity of mercury, Leiden Commun. 122b, 1240 (1911)
9.10.
J. Bardeen, L. N. Cooper, J. R. Schrieffer: Theory of superconductivity, Phys. Rev. 108, 1175–1204 (1957)CrossRef
9.11.
J. G. Bednorz, K. A. Müller: Possible high-T c superconductivity in the Ba-La-Cu-O system, Z. Phys. B 64, 189–193 (1986)CrossRef
9.12.
M. K. Wu, J. R. Ashburn, C. J. Torng, P. H. Hor, L. R. Meng, L. Gao, Z. J. Huang, Y. Q. Wang, C. W. Chu: Superconductivity in a new mixed phase Y-Ba-Cu-O system at ambient pressure, Phys. Rev. Lett. 58, 908–910 (1987)CrossRef
9.13.
C. N. R. Rao, R. Nagarajan, R. Vijayaraghavan: Synthesis of cuprate superconductors, Supercond. Sci. Technol. 6, 1–22 (1993)CrossRef
9.14.
J. Clarke, A. I. Braginski: The SQUID Handbook, Fundamentals and Technology of SQUIDs and SQUID Systems, Vol. 1 (Wiley, New York 2004)
9.15.
B. D. Josephson: Possible new effects in superconductive tunneling, Phys. Lett. 1, 251–253 (1962)CrossRef
9.16.
R. Pöpel: The Josephson effect and voltage standards, Metrologia 29, 153–174 (1992)CrossRef
9.17.
S. A. Keys, D. P. Hampshire: Characterization of the transport critical current density for conductor applications, Handbook of Superconducting Materials II : Characterization, Applications and Cryogenics, ed. by D. A. Cardwell, D. S. Ginley (IOPP, London 2003) p. 1297
9.18.
W. Meissner, R. Ochsenfeld: Ein neuer Effekt bei Eintritt der Supraleitfähigkeit, Naturwiss. 21, 787 (1933) (in German)CrossRef
9.19.
DIN EN IEC 61788-1: Superconductivity – Critical, Current Measurement – DC Critical Current of Cu/Nb-Ti Composite Superconductors (Beuth, Berlin 1999)
9.20.
P. W. Atkins: Physikalische Chemie, 3rd edn. (VCH, Weinheim 1990) pp. 3834–846 German transl.
9.21.
C. H. Hamann, W. Vielsich: Elektrochemie, 3rd edn. (VCH, Weinheim 1998)
9.22.
J. M. G. Barthel, H. Krienke, W. Kunz: Physical Chemistry of Electrolyte Solutions – Modern Aspects; Top. Phys. Chem., Vol. 5, ed. by J. M. G. Barthel, H. Krienke, W. Kunz (Springer, Berlin, Heidelberg 1998)
9.23.
J. O. M. Bockris, A. K. N. Reddy, K. N. Amlya: Modern Electrochemistry 1, Ionics, 2nd edn. (Springer, Berlin, Heidelberg 1989) p. 379
9.24.
O. F. Mohammed, D. Pines, J. Dreyer, E. Pines, E. T. J. Nibbering: Sequential proton transfer through water bridges in acid-base reactions, Science 310, 83–86 (2005)CrossRef
9.25.
F. Brinkmann, N. E. Dam, E. Deák, F. Durbiano, E. Ferrara, J. Fükö, H. D. Jensen, M. Máriássy, R. H. Shreiner, P. Spitzer, U. Sudmeier, M. Surdu: Primary methods for the measurement of electrolytic conductivity, Accred. Qual. Assur. 8, 346–353 (2003)CrossRef
9.26.
United States Pharmacopeia: USP 27-NF 22 (U.S. Pharmacopoeia, Rockville 2004)
9.27.
ISO 7888: 1985 Water Quality: Determination of electrical conductivity (ISO, Geneva 1985)
9.28.
Y. C. Wu, K. W. Pratt, W. F. Koch: Determination of the absolute specific conductance of primary standard KCl solutions, J. Solution Chem. 18, 515–528 (1989)CrossRef
9.29.
G. Jones, S. M. Christian: The measurement of the conductance of electrolytes. VI. Galvanic polarization by alternating current, J. Am. Chem. Soc. 57, 272–284 (1935)CrossRef
9.30.
P. Spitzer, U. Sudmeier: Electrolytic conductivity—A new subject field at PTB, Report on the 146 PTB Seminar Electrolytic Conductivity, ed. by P. Spitzer, U. Sudmeier (PTB-ThEx-15, Physikalisch-Technische Bundesanstalt, Braunschweig 2000) pp. 39–47
9.31.
P. Saulnier: Absolute determination of the conductivity of electrolytes. Double differential cell with adjustable constant, J. Solution Chem. 8, 835–845 (1979)CrossRef
9.32.
P. Saulnier, J. Barthel: Determination of electrolytic conductivity of a 0.01 D aqueous potassium chloride solution at various temperatures by an absolute method, J. Solution Chem. 8, 847–851 (1979)CrossRef
9.33.
F. Löffler: Design and production of the electric conductivity cell, Report on the 146 PTB Seminar Electrolytic Conductivity, ed. by P. Spitzer, U. Sudmeier (PTB-ThEx-15, Physikalisch Technische Bundesanstalt, Braunschweig 2000) pp. 49–64
9.34.
Y. C. Wu, W. F. Koch, D. Feng, L. A. Holland, A. E. Juhász, A. Tomek: A DC method for the absolute dtermination of conductivities of the primary standard KCl solutions from 0 °C to 50 °C, J. Res. Natl. Inst. Stand. Technol. 99, 241–224 (1994)
9.35.
D. F. Evans: The measurement and interpretation of electrolytic conductivity, Techn. Electrochem. 2 (Wiley, New York 1973)
9.36.
T. S. Light: Temperature dependence and measurement of resistivity of pure water, Anal. Chem. 56, 1138–1142 (1994)CrossRef
9.37.
Radiometer Analytical: Conductivity Theory and Practice, Radiometer Analytical, Villeurbanne, France www.radiometer-analytical.com
9.38.
European Pharmacopeia: Conductivity, EP 4, 2.2.38 (European Pharmacopeia, Strasbourg 2004) (http://​www.​pheur.​org/​)
9.39.
W. L. Marshall: Electrical conductance of liquid and supercritical water evaluated from 0 °C and 0.1 MPa to high temperatures and pressures. Reduced-state relationships, J. Chem. Eng. Data 32, 221–226 (1987)CrossRef
9.40.
R. D. Thornton, T. S. Light: A new approach to accurate resistivity measurement of high purity water, Ultrapure Water 7 (1989)
9.41.
P. Spitzer, B. Rossi, Y. Gignet, S. Mabic, U. Sudmeier: New approach to calibrating conductivity meters in the low conductivity range, Accred. Qual. Assur. 10, 78–81 (2005)CrossRef
9.42.
H. D. Jensen, J. Sørensen: Electrolytic conductivity at DFM—results and experiences, Report on the 146 PTB Seminar Electrolytic Conductivity, ed. by P. Spitzer, U. Sudmeier (PTB-ThEx-15, Physikalisch-Technische Bundesanstalt, Braunschweig 2000) pp. 153–13
9.43.
D. C. Look: Electrical Characterization of GaAs Materials and Devices (Wiley, Chichester 1989)
9.44.
P. Blood, J. W. Orton: The Electrical Characterization of Semiconductors: Majority Carriers and Electron States (Academic, New York 1992)
9.45.
E. B. Hansen: On the influence of shape and variations in conductivity of the sample on four-point measurements, Appl. Sci. Res. B 8, 93–104 (1960)CrossRef
9.46.
R. L. Petritz: Theory of an experiment for measuring the mobility and density of carriers in the space-charge region of a semiconductor surface, Phys. Rev. 110, 1254–1262 (1958)CrossRef
9.47.
L. J. van der Pauw: A method of measuring specific resistivity and hall effect of discs of arbitrary shape, Philips Res. Rep. 13, 1–9 (1958)
9.48.
S. M. Sze: Physics of Semiconductor Devices (Wiley, Chichester 1981)
9.49.
K. Ziegler, E. Klausmann, S. Kar: Determination of the semiconductor doping profile right up to its surface using the MIS capacitor, Solid-State Electron. 18, 189–198 (1975)CrossRef
9.50.
D. P. Kennedy, P. C. Murley, W. Kleinfelder: On the measurement of impurity distributions in silicon by the differential capacitance technique, IBM J. Res. Dev, 399–409 (Sept. 1968)
9.51.
D. P. Kennedy, R. P. O'Brian: On the measurement of impurity atom distributions by the differential capacitance technique, IBM J. Res. Dev. 212–214 (March 1969)
9.52.
W. C. Johnson, P. T. Panousis: The influence of Debye length on the C–V-measurement of doping profiles, IEEE Trans. ED 18, 956–973 (1971)
9.53.
W. A. Harrison: Electronic Structure and the Properties of Solids: The Physics of the Chemical Bond (Dover, New York 1989)
9.54.
S.R. Forest, R. F. Leheny, R. E. Nahory, M. A. Pollack: In0.53Ga0.47As photodiodes with dark current limited by generation-recombination and tunneling, Appl. Phys. Lett. 37(3), 322–325 (1980)CrossRef
9.55.
A. Goetzberger, B. McDonald, R. H. Haitz, R. M. Scarlett: Avalanche effects in silicon p-n junction. II. structurally perfect junctions, J. Appl. Phys. 34, 1591 ff. (1963)CrossRef
9.56.
G. L. Miller, D. V. Lang, L. C. Kimerling: Capacitance transient spectroscopy, Ann. Rev. Mater. Sci. 7, 377–448 (1977)CrossRef
9.57.
D. V. Lang: Deep-level transient spectroscopy, J. Appl. Phys. 45(7), 3023–3032 (1974)CrossRef
9.58.
R. N. Hall: Electron-hole recombination in germanium, Phys. Rev. 87, 387 (1952)CrossRef
9.59.
W. Shockley, W. T. Read: Statistics of the recombinations of holes and electrons, Phys. Rev. 87, 835–842 (1952)CrossRef
9.60.
D. L. Partin, J. W. Chen, A. G. Milnes, L. F. Vassamillet: J. Appl. Phys. 50(11), 6845 ff (1979)CrossRef
9.61.
E. H. Rhoderick: Metal-Semiconductor Contacts (Clarendon, Oxford 1980)
9.62.
A. Piotrowska, A. Guivarc'h, G. Pelous: Ohmic contacts to III-V compound semiconductors: A review of fabrication techniques, Solid-State Electron. 26(3), 179–197 (1983)CrossRef
9.64.
H. H. Berger: Models for contacts to planar devices, Solid-State Electron. 15, 145–158 (1972)CrossRef
9.63.
R. H. Cox, H. Strack: Ohmic contacts for GaAs devices, Solid-State Electron. 10, 1213–1218 (1967)CrossRef
9.65.
P. W. Debye: Polar Molecules (Chemical Catalog, New York 1927)
9.66.
C. P. Smyth: Dielectric Behavior and Structure (McGraw Hill, New York 1955)
9.67.
K. S. Cole, R. H. Cole: Absorption in dielectrics dispersion, J. Chem. Phys. 9, 341 (1941)CrossRef
9.68.
H. Fröhlich: Theory of Dielectrics (Oxford Univ. Press, Oxford 1949)
9.69.
N. Hill, W. E. Vaughman, A. H. Price, M. M. Davies: Dielectric Properties and Molecular Behavior (Van Nostrand Reinhold, New York 1969)
9.70.
C. J. F. Bottcher, P. Bordewijk: Theory of Electric Polarization (Elsevier, New York 1996)
9.71.
N. G. McCrum, B. E. Read, G. Williams: Anelastic and Dielectric Effects in Polymeric Solids (Wiley, New York 1967)
9.72.
J. P. Runt, J. J. Fitzgerald: Dielectric Spectroscopy of Polymeric Materials (Am. Chem. Soc., Washington 1997)
9.73.
D. W. Davies: The Theory of the Electric and Magnetic Properties of Molecules (Wiley, New York 1969)
9.74.
A. R. von Hippel (ed.): Dielectric Materials Applications (Wiley, New York 1954)
9.75.
H. E. Bussey: Measurement of RF properties of materials, A survey, Proc. IEEE 55(5), 1046–1053 (1967)CrossRef
9.76.
S. O. Nelson: Dielectric properties of agricultural products, IEEE Trans. El. Insul. 26, 845–869 (1991)CrossRef
9.77.
A. W. Kraszewski, S. Trabelsi, S. O. Nelson: Broadband microwave wheat permittivity meaurements in free space, J. Microwave Power Electromag. Energy 37, 41–54 (2002)
9.78.
F. Kremer, A. Schönhals: Broadband Dielectric Spectroscopy (Springer-Verlag, Berlin, Heidelberg 2003)
9.79.
J. C. Maxwell: An Elementary Treatise on Electricity, 2nd edn. (Clarendon, Oxford 1888)
9.80.
S. Havriliak, S. J. Negami: A complex plane analysis of α-dispersions in some polymer systems, J. Polym. Sci. C: Polym. Symp. 14, 99 (1966)CrossRef
9.81.
D. W. Davidson, R. H. Cole: Dielectric relaxation in glicerine, J. Chem. Phys. 18, 1417 (1950)CrossRef
9.82.
V. V. Novikov, V. P. Privalko: Temporal fractal model for the anomalous dielectric relaxation of inhomogeneous media with chaotic structure, Phys. Rev. E 64, 031504 (2001)CrossRef
9.83.
V. V. Daniel: Dielectric Relaxation (Academic, London 1967)
9.84.
A. K. Jonsher: Dielectric Relaxation in Solids (Chelsea Dielectrics, London 1983)
9.85.
F. Alvarez, A. Alegria, J. Colmenero: A new method for obtaining distribution of relaxation times from frequency relaxation spectra, J. Chem. Phys. 103, 798–806 (1995)CrossRef
9.86.
H. Schäfer, E. Sternin, R. Stannarius, M. Arndt, F. Kremer: Novel approach to the analysis of broadband dielectric spectra, Phys. Rev. Lett. 76, 2177–2180 (1996)CrossRef
9.87.
L. Hartshorn, W. H. Ward: The measurement of the permittivity and power factor of dielectrics from 104 to 108 cycles per second, J. Inst. Electr. Eng. 79, 567–609 (1936)
9.88.
Agilent Technologies: Accessories Selection Guide For Impedance Measurements, Dielectric Test Fixtures (Agilent Technologies, Palo Alto 2001) p. 38 www.agilent.com
9.89.
Application Note 1369-1: Agilent Solutions for Measuring Permittivity and Permeability with LCR Meters and Impedance Analyzers (Agilent Technologies, Palo Alto 2001) www.agilent.com
9.90.
ASTM D 150-98: Standard Test Method for AC Loss Characteristics and Permittivity of Solid Electrical Insulating Materials (ASTM, West Conshohocken 1998) www.astm.org
9.91.
D. A. Gray: Handbook of Coaxial Microwave Measurements (General Radio, West Concord. 1968)
9.92.
S. Ramo, J. R. Whinnery, T. Van Duzer: Fields and Waves in Communication Electronics (Wiley, New York 1994)
9.93.
Agilent Technologies: RF and Microwave Test Accessories (Agilent Technologies, Palo Alto 2006) www.agilent.com
9.94.
J. P. Grant, R. N. Clarke, G. T. Symm, N. Spyrou: Acritical study of the open-ended coaxial line sensor technique for RF and microwave complex permittivity measurements, J. Phys. E Sci. Instrum. 22, 757–770 (1989)CrossRef
9.95.
Agilent Technologies: 85070C Dielectric Probe Kit (Agilent Technologies, Palo Alto 2005) www.agilent.com
9.96.
M. A. Stuchly, S. S. Stuchly: Coaxial line reflection methods for measuring dielectric properties of biological substances at radio and microwave frequencies: A review, IEEE Trans. Instrum. Meas 29, 176–183 (1980)CrossRef
9.97.
M. F. Iskander, S. S. Stuchly: Fringing field effect in the lumped-capacitance method for permittivity measurements, IEEE Trans. Instrum. Meas 27, 107–109 (1978)CrossRef
9.98.
J. K. Hunton: Analysis of microwave techniques by means of signal flow graphs, IRE Trans. Microwave Theory Tech. 8, 206–212 (1960)CrossRef
9.99.
K. Kurokawa: Power waves and the scattering matrix, IEEE Trans. Microwave Theory Tech. 13, 194–202 (1965)CrossRef
9.100.
A. M. Nicolson: Broad-band microwave transmission characteristics from a single measuramant of the transient response, IEEE Trans. Instrum. Meas. 19, 337–382 (1970)CrossRef
9.101.
S. S. Stuchly, M. Matuszewski: A combined total reflection-transmission method in application to dielectric spectroscopy, IEEE Trans. Instrum. Meas 27, 285–288 (1978)CrossRef
9.102.
Product Note 8510-3: Measuring the dielectric constant of solids with the HP network analyzer (Hewlett Packard, Palo Alto 1985)
9.103.
J. Baker-Jarvis, R. G. Geyer, P. D. Domich: A nonlinear least-squares with causality constraints applied to transmission line permittivity, IEEE Trans. Intrum. Meas 41, 646–652 (1992)CrossRef
9.104.
J. Obrzut, A. Anopchenko: Input impedance of a coaxial line terminated with a complex gap capacitance – numerical experimental analysis, IEEE Trans. Instrum. Meas 53, 1197–1202 (2004)CrossRef
9.105.
Institute for Printed Circuits: Standard Test Method Manual, TM-650, Method 2.5.5.10, High frequency testing to determine permittivity and loss tangent of embedded passive materials (IPC, Bannockburn 2005) www.ipc.org
9.106.
ASTM D2520-01: Standard Test Methods for Complex Permittivity (Dielectric Constant) of Solid Electrical Insulating Materials at Microwave Frequencies and Temperatures to 1650 °C, Test method B-Resonant Cavity Perturbation Method (ASTM, West Conshohocken 1998) www.astm.org
9.107.
G. Kent: Nondestructive permittivity measurements of substrates, IEEE Trans. Instrum. Meas. 45, 102–106 (1996)CrossRef
9.108.
S. Maj, M. Pospieszalski: Acomposite multilayered cylindrical dielectric resonator, IEEE MTT-S Digest, 190–192 (1984)
9.109.
J. Krupka, K. Derzakowski, A. Abramowicz, M. E. Tobar, R. G. Geyer: Use of whispering-gallery modes for complex permittivity determinations of ultra-low-loss dielectric materials, IEEE Trans. Microwave Theory Tech. 47, 752–759 (1999)CrossRef
9.110.
G. I. Woolaver: Accurately measure dielectric constant of soft substrates, Microwave and RF 24, 153–158 (1990)
9.111.
S. S. Stuchly, M. A. Rzepecka, M. F. Iskander: Permittivity measurements at microwave frequencies using lumped elements, IEEE Trans Instr. Meas 23, 56–62 (1974)CrossRef
Metadata
Title
Electrical Properties
Authors
Bernd Schumacher, Dr.
Heinz-Gunter Bach, Ph.D.
Petra Spitzer
Jan Obrzut, Dr.
Copyright Year
2006
Book
Springer Handbook of Materials Measurement Methods

Print ISBN: 978-3-540-20785-6

Electronic ISBN: 978-3-540-30300-8

Copyright Year: 2006

DOI
https://doi.org/10.1007/978-3-540-30300-8_9

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