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Published in:

26-09-2023

Electrothermal properties of 2D materials in device applications

Authors: Samantha Klein, Zlatan Aksamija

Published in: Journal of Computational Electronics | Issue 5/2023

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Abstract

To continue downscaling transistors, new materials must be explored. Two-dimensional (2D) materials are appealing due to their thinness and bandgap. The relatively weak van der Waals forces between layers in 2D materials allow easy exfoliation and device fabrication but also result in poor heat transfer between layers and to the substrate, which is the main path for heat removal, resulting in self-heating and thermal degradation of mobility. This study explores the electrothermal properties of five popular 2D materials (MoS2, MoSe2, WS2, WSe2, and 2D black phosphorous). We simulate various devices with self-heating with a range of gate and drain biases and examine the effects on mobility and change in device temperature. The effects are compared to the isothermal case to ascertain the impact of self-heating. We observe that Joule heating has a significant effect on temperature rise, layerwise drain current, and effective mobility. We show that black phosphorous performs the best thermally, owing to its relatively high thermal conductance to the substrate, while WSe2 performs the best electrically. This study will inform future thermally aware designs of nanoelectronic devices based on 2D materials.

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Literature
1.
go back to reference Yasaei, P., Foss, C.J., Karis, K., Behranginia, A., El-Ghandour, A.I., Fathizadeh, A., Olivares, J., Majee, A.K., Foster, C.D., Khalili-Araghi, F., Aksamija, Z., Salehi-Khojin, A.: Interfacial thermal transport in monolayer MoS2 and graphene- based devices. Adv. Mater. Interfaces 4(7), 1700334 (2017). https://doi.org/10.1002/admi.201700334CrossRef Yasaei, P., Foss, C.J., Karis, K., Behranginia, A., El-Ghandour, A.I., Fathizadeh, A., Olivares, J., Majee, A.K., Foster, C.D., Khalili-Araghi, F., Aksamija, Z., Salehi-Khojin, A.: Interfacial thermal transport in monolayer MoS2 and graphene- based devices. Adv. Mater. Interfaces 4(7), 1700334 (2017). https://​doi.​org/​10.​1002/​admi.​201700334CrossRef
5.
10.
go back to reference Pak, J., Jang, Y., Byun, J., Cho, K., Kim, T.Y., Kim, J.K., Choi, B.Y., Shin, J., Hong, Y., Chung, S., Lee, T.: Two-dimensional thickness-dependent avalanche breakdown phenomena in MoS\(_2\) field-effect transistors under high electric fields. ACS Nano 12(7), 7109–7116 (2018). https://doi.org/10.1021/acsnano.8b02925CrossRef Pak, J., Jang, Y., Byun, J., Cho, K., Kim, T.Y., Kim, J.K., Choi, B.Y., Shin, J., Hong, Y., Chung, S., Lee, T.: Two-dimensional thickness-dependent avalanche breakdown phenomena in MoS\(_2\) field-effect transistors under high electric fields. ACS Nano 12(7), 7109–7116 (2018). https://​doi.​org/​10.​1021/​acsnano.​8b02925CrossRef
11.
go back to reference Arora, A., Nogajewski, K., Molas, M., Koperski, M., Potemski, M.: Exciton band structure in layered MoSe\(_2\): from a monolayer to the bulk limit. Nanoscale 7(48), 20769–20775 (2015)CrossRef Arora, A., Nogajewski, K., Molas, M., Koperski, M., Potemski, M.: Exciton band structure in layered MoSe\(_2\): from a monolayer to the bulk limit. Nanoscale 7(48), 20769–20775 (2015)CrossRef
12.
go back to reference Zhuang, P., Liu, J., Huang, J., Dou, C., Cai, W., Lin, W.: Charge distribution in turbostratic few-layer graphene studied by carbon isotope labeling. Carbon 189, 21–26 (2022)CrossRef Zhuang, P., Liu, J., Huang, J., Dou, C., Cai, W., Lin, W.: Charge distribution in turbostratic few-layer graphene studied by carbon isotope labeling. Carbon 189, 21–26 (2022)CrossRef
14.
16.
20.
21.
go back to reference Yasaei, P., Hemmat, Z., Foss, C.J., Li, S.J., Hong, L., Behranginia, A., Majidi, L., Klie, R.F., Barsoum, M.W., Aksamija, Z., Salehi-Khojin, A.: Enhanced thermal boundary conductance in few-layer Ti\(_3\)C\(_2\) mxene with encapsulation. Adv. Mater. 30(43), 1801–629 (2018). https://doi.org/10.1002/adma.201801629CrossRef Yasaei, P., Hemmat, Z., Foss, C.J., Li, S.J., Hong, L., Behranginia, A., Majidi, L., Klie, R.F., Barsoum, M.W., Aksamija, Z., Salehi-Khojin, A.: Enhanced thermal boundary conductance in few-layer Ti\(_3\)C\(_2\) mxene with encapsulation. Adv. Mater. 30(43), 1801–629 (2018). https://​doi.​org/​10.​1002/​adma.​201801629CrossRef
24.
Metadata
Title
Electrothermal properties of 2D materials in device applications
Authors
Samantha Klein
Zlatan Aksamija
Publication date
26-09-2023
Publisher
Springer US
Published in
Journal of Computational Electronics / Issue 5/2023
Print ISSN: 1569-8025
Electronic ISSN: 1572-8137
DOI
https://doi.org/10.1007/s10825-023-02091-z