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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 6/2011

01-06-2011 | Erratum

Erratum to: Characterization and analysis of CaO–SiO2–B2O3 ternary system ceramics

Authors: Ming He, Shuren Zhang, Xiaohua Zhou

Published in: Journal of Materials Science: Materials in Electronics | Issue 6/2011

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Unfortunately, the first names and surnames of the authors were interchanged in the original publication of the article. …
previous article In situ optical inspection of electrochemical migration during THB tests

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Metadata
Title
Erratum to: Characterization and analysis of CaO–SiO2–B2O3 ternary system ceramics
Authors
Ming He
Shuren Zhang
Xiaohua Zhou
Publication date
01-06-2011
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 6/2011
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-010-0205-9

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