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3D-Printed Sensor Array of Semiconducting Oxides Read chapter Read first chapter

2020 | OriginalPaper | Chapter

Evaluation of Radiation Hardness of the Bipolar Devices in the Space Conditions

Authors : A. S. Rodin, A. S. Bakerenkov, V. A. Felitsyn, V. S. Pershenkov, V. A. Telets

Published in: 4th International Conference on Nanotechnologies and Biomedical Engineering

Publisher: Springer International Publishing

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Abstract

Real time dependence of operation temperature, which is typical for space environment, was taken into account in the numerical simulation of radiation degradation of LM111 bipolar voltage comparator input current. The technique and results of performed numerical analyses are presented and discussed.

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Metadata
Title
Evaluation of Radiation Hardness of the Bipolar Devices in the Space Conditions
Authors
A. S. Rodin
A. S. Bakerenkov
V. A. Felitsyn
V. S. Pershenkov
V. A. Telets
Copyright Year
2020
Book
4th International Conference on Nanotechnologies and Biomedical Engineering

Print ISBN: 978-3-030-31865-9

Electronic ISBN: 978-3-030-31866-6

Copyright Year: 2020

DOI
https://doi.org/10.1007/978-3-030-31866-6_143