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Published in:
2015 | OriginalPaper | Chapter
Fault Attacks by using Voltage and Temperature Variations: An Investigation and Analysis of Experimental Environment
Authors : Young Sil Lee, Non Thiranant, HyeongRag Kim, JungBok Jo, HoonJae Lee
Published in: Information Science and Applications
Publisher: Springer Berlin Heidelberg
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Physical attacks are a powerful tools to exploit implemented weaknesses of embedded devices even if that using robust cryptography algorithms. Various physical attack techniques have been researched, both to make practical several theoretical or physical fault/error models proposed in open literature and to outline new kinds of vulnerabilities. In this paper, we investigated and summarized the classification of physical attacks; especially we focused on fault attack by using voltage and temperature variations which is one of the types of glitch attacks in non-invasive attacks. Also we investigated and compared several case of experimental environment for fault attacks by using temperature and voltage variations.