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Journal of Materials Science: Materials in Electronics

Growth of rod structure with static electrical field in the Al–Ni eutectic system

  • 14-07-2020
Published in:
Authors
Sercan Basit
Semih Birinci
Necmettin Maraşlı
Published in
Journal of Materials Science: Materials in Electronics | Issue 17/2020

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Abstract

The influence of the positive and negative static electrical fields (E+ and E−, respectively) on eutectic rod spacing (λ), eutectic grain size (EGS), hardness (HB) and ultimate tensile strength for Al–6.4 wt % Ni eutectic alloy directionally solidified from bottom to upward were investigate. The applied electric field constitutes an electrical force on liquid ions and the electrical field force leads an increment and decrement in the atomic mass flux at the solid–liquid interface when its direction is the parallel or antiparallel with solid liquid interface growth direction, respectively. Dependence of the λ, EGS, HB and σUTS values on E+ and E− values were obtained to be \(\lambda_{{}}^{ + } = 2.57 \times E_{ + }^{2.87}\), \(\lambda_{{}}^{ - } = 0.73 \times E_{ - }^{ - 1.41}\), \({\text{EGS}}_{{}}^{ + } = 362242.99 \times E_{ + }^{7.75}\), \({\text{EGS}}_{{}}^{ - } = 12189.89 \times E_{ - }^{ - 4.89}\), \({\text{HB}}_{{}}^{ + } = 2102.03 \times E_{ + }^{ - 0.61}\), \({\text{HB}}_{{}}^{ - } = 0.602 \times E_{ - }^{0.63}\), \(\sigma_{\text{UTS}}^{ + } = 111.99 \times E_{ + }^{ - 1.31}\) and \(\sigma_{\text{UTS}}^{ - } = 256.79 \times E_{ - }^{1.12}\), respectively by linear regression analysis. The exponent values of E+ and E− for EGS are higher than the exponent values of E+ and E− for λ, ΗΒ and σUTS.

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Title
Growth of rod structure with static electrical field in the Al–Ni eutectic system
Authors
Sercan Basit
Semih Birinci
Necmettin Maraşlı
Publication date
14-07-2020
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 17/2020
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-03960-0
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