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Journal of Electronic Testing

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02-05-2018

Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing

Authors: Ke Huang, Manuel J. Barragan

Published in: Journal of Electronic Testing | Issue 3/2018

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Nowadays, complex nano-electronic systems are being developed and deployed for applications covering every facet of modern life. To interact with environment and users, integrated circuits need analog, mixed-signal, RF or MEMS blocks. However, as it happens with design automation, analog and mixed-signal test solutions are much less generic than their siblings from the digital world. Thus, even if these functions represent a small fraction of system silicon area, testing them accounts for a large portion of the overall manufacturing cost. Moreover, with the rise of safety-critical applications, reliability requirements are increasing and quality is nowadays a strong asset in competitive markets. Specification-based test at the production line cannot be considered enough any longer and testability, reliability, and robustness along the complete lifetime of the system are becoming a design specification. Undoubtedly, this is an opportunity for the analog and mixed-signal test community. …

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Title: Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing
Authors: Ke Huang
Manuel J. Barragan
Publication date: 02-05-2018
Publisher: Springer US
Published in: Journal of Electronic Testing / Issue 3/2018
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI: https://doi.org/10.1007/s10836-018-5731-z

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Other articles of this Issue 3/2018

A Classification Approach for an Accurate Analog/RF BIST Evaluation Based on the Process Parameters

Gate Oxide Short Defect Model in FinFETs

Digital Predistortion for Spectrum Compliance in the Internet of Things

A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits

Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal

Practical Harmonic Cancellation Techniques for the On-Chip Implementation of Sinusoidal Signal Generators for Mixed-Signal BIST Applications