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Published in:
2009 | OriginalPaper | Chapter
High Energy-Loss Spectra and Images
Authors : David B. Williams, C. Barry Carter
Published in: Transmission Electron Microscopy
Publisher: Springer US
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The high energy-loss spectrum (
E
>50 eV) consists primarily of ionization or core-loss edges on a rapidly decreasing plural-scattering background. Elemental-composition data and elemental maps can be extracted from these ionization edges. In this chapter, we’ll examine how to get this information, quantify it, and image it. A good use for such data is lightelement analysis wherein EELS complements XEDS. First, we’ll remind you of the experimental variables over which you have control, because these are rather critical. Then we’ll discuss how to obtain a spectrum and what it should look like if you’re going to quantify it.