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2012 | OriginalPaper | Chapter

High Resolution ExitWave Restoration

Authors : Sarah J. Haigh, Angus I. Kirkland

Published in: Modeling Nanoscale Imaging in Electron Microscopy

Publisher: Springer US

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Abstract

We review the use of restoration methods that recover the complex specimen exit wave from a suitably conditioned data set of high resolution transmission electron microscope images. Various levels of theory underlying the post-acquisition processing required are described together with the requirements for aberration measurement.

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previous chapter The Application of Scanning Transmission Electron Microscopy (STEM) to the Study of Nanoscale Systems

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The origin of the use of real space order when describing an aberration coefficient originates from the ray-optical theory of Seidel aberrations which are described in terms of displacements of ray-path intersections with the image plane. As these displacements are proportional to the gradient of the wave aberration function, an nth order Seidel aberration corresponds to a term of order n + 1 in W. As an example, the image aberration for defocus is linear in angle and is hence described as a first-order aberration, whereas the image aberration for spherical aberration is cubic in angle and is hence described as a third-order aberration.

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Title: High Resolution ExitWave Restoration
Authors: Sarah J. Haigh
Angus I. Kirkland
Publisher: Springer US
Book: Modeling Nanoscale Imaging in Electron Microscopy
Print ISBN: 978-1-4614-2190-0

Electronic ISBN: 978-1-4614-2191-7

Copyright Year: 2012
DOI: https://doi.org/10.1007/978-1-4614-2191-7_3

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