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Scanning Electrochemical Potential Microscopy (SECPM) and Electrochemical STM (EC-STM) Read chapter Read first chapter

2015 | OriginalPaper | Chapter

15. High Resolution STM Imaging

Author : Alexander N. Chaika

Published in: Surface Science Tools for Nanomaterials Characterization

Publisher: Springer Berlin Heidelberg

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Abstract

Scanning tunneling microscopy (STM) is one of the basic techniques for the analysis of surface reconstructions, overlayer growth mechanisms, surface dynamics, and chemistry at the atomic scale. STM is used in physics, chemistry, and biology for high resolution studies of organic and inorganic nanoobjects. This chapter is devoted to STM imaging at the level of individual electron orbitals which can lead to improvement of the spatial resolution in STM experiments down to the subatomic scale and development of chemical-selective imaging of multi-component surfaces.

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previous chapter Combining Micromanipulation, Kerr Magnetometry and Magnetic Force Microscopy for Characterization of Three-Dimensional Magnetic Nanostructures
next chapter Numerical and Finite Element Simulations of Nanotips for FIM/FEM
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Metadata
Title
High Resolution STM Imaging
Author
Alexander N. Chaika
Copyright Year
2015
Publisher
Springer Berlin Heidelberg
Book
Surface Science Tools for Nanomaterials Characterization

Print ISBN: 978-3-662-44550-1

Electronic ISBN: 978-3-662-44551-8

Copyright Year: 2015

DOI
https://doi.org/10.1007/978-3-662-44551-8_15

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