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Excitation and Mechanisms of Single Molecule Reactions in Scanning Tunneling Microscopy Read chapter Read first chapter

2011 | OriginalPaper | Chapter

11. High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth

Authors : Bryan D. Huey, Ramesh Nath

Published in: Scanning Probe Microscopy of Functional Materials

Publisher: Springer New York

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Abstract

High-speed piezo force microscopy (HSPFM) has been developed to map ferroelectric properties with imaging rates beyond 1frame/s. In addition to efficient measurements of large areas, multiple samples, and various experimental conditions, this capability is particularly advantageous for monitoring ferroelectric domain poling dynamics. As discussed, this includes identifying switching mechanisms, elucidating the influence of structural defects, and especially quantifying and mapping nucleation times and growth rates. Domains written with tip speeds beyond 1cm/s are also presented and analyzed.

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previous chapter Quantitative Piezoresponse Force Microscopy: Calibrated Experiments, Analytical Theory and Finite Element Modeling
next chapter Polar Structures in Relaxors by Piezoresponse Force Microscopy
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Metadata
Title
High-Speed Piezo Force Microscopy: Novel Observations of Ferroelectric Domain Poling, Nucleation, and Growth
Authors
Bryan D. Huey
Ramesh Nath
Copyright Year
2011
Publisher
Springer New York
Book
Scanning Probe Microscopy of Functional Materials

Print ISBN: 978-1-4419-6567-7

Electronic ISBN: 978-1-4419-7167-8

Copyright Year: 2011

DOI
https://doi.org/10.1007/978-1-4419-7167-8_11

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