Skip to main content
Top

2017 | OriginalPaper | Chapter

34. II-VI Narrow Bandgap Semiconductors: Optoelectronics

Author : Ian M. Baker

Published in: Springer Handbook of Electronic and Photonic Materials

Publisher: Springer International Publishing

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

The main purpose of this chapter is to describe the applications and technology of II–VI narrow bandgap semiconductors, focussing on HgCdTe for infrared sensors. It provides a historical record of the development HgCdTe through photoconductors and photodiode arrays. The solid-state physics of HgCdTe is described to provide a foundation to explain the main crystal growth processes and device technologies. It concludes with a review of the research and development programs in centers around the world on third-generation infrared detector technology (so-called GEN III detectors). These include small pixel technology, higher operating temperature (HOT) device structures, two-color array technology, electron avalanche photodiodes (e-APDs), multifunctional HgCdTe detectors, retina level processing, and future trends for HgCdTe infrared detector arrays.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literature
34.1
go back to reference W.D. Lawson, S. Nielsen, E.H. Putley, Y.S. Young: J. Phys. Chem. Solids 9, 325 (1959) W.D. Lawson, S. Nielsen, E.H. Putley, Y.S. Young: J. Phys. Chem. Solids 9, 325 (1959)
34.2
go back to reference C.T. Elliott, N.T. Gordon: Infrared detectors. In: Handbook on Semiconductors, ed. by C. Hilsum (North-Holland, Amsterdam 1993) p. 841 C.T. Elliott, N.T. Gordon: Infrared detectors. In: Handbook on Semiconductors, ed. by C. Hilsum (North-Holland, Amsterdam 1993) p. 841
34.3
go back to reference C.T. Elliott: Infrared detectors. In: Handbook on Semiconductors, Vol. 4, ed. by C. Hilsum (North-Holland, Amsterdam 1981) p. 727 C.T. Elliott: Infrared detectors. In: Handbook on Semiconductors, Vol. 4, ed. by C. Hilsum (North-Holland, Amsterdam 1981) p. 727
34.4
go back to reference A. Kolodny, I. Kidron: Infrared Phys. 22, 9 (1992) A. Kolodny, I. Kidron: Infrared Phys. 22, 9 (1992)
34.5
34.6
go back to reference C.T. Elliott: Electron. Lett. 17, 312 (1981) C.T. Elliott: Electron. Lett. 17, 312 (1981)
34.7
go back to reference C.T. Elliott, D. Day, D.J. Wilson: Infrared Phys. 22, 31 (1982) C.T. Elliott, D. Day, D.J. Wilson: Infrared Phys. 22, 31 (1982)
34.8
go back to reference C.T. Elliott, C.L. Jones: Narrow-Gap II–VI Compounds for Optoelectronic and Electromagnetic Applications (Chapman Hall, New York 1997), Chap. 16 C.T. Elliott, C.L. Jones: Narrow-Gap II–VI Compounds for Optoelectronic and Electromagnetic Applications (Chapman Hall, New York 1997), Chap. 16
34.9
go back to reference R.M. Broudy, V.J. Mazurczyk: (HgCd)Te photoconductivity detectors. In: Semiconductors and Semimetals, Vol. 18, ed. by R.K. Williardson, A. Beer (Academic, Cambridge 1981) p. 157 R.M. Broudy, V.J. Mazurczyk: (HgCd)Te photoconductivity detectors. In: Semiconductors and Semimetals, Vol. 18, ed. by R.K. Williardson, A. Beer (Academic, Cambridge 1981) p. 157
34.10
34.11
go back to reference M.B. Reine, K.R. Maschoff, S.B. Tobin, P.W. Norton, J.A. Mroczkowski, E.E. Krueger: Semicond. Sci. Technol. 8, 788 (1993) M.B. Reine, K.R. Maschoff, S.B. Tobin, P.W. Norton, J.A. Mroczkowski, E.E. Krueger: Semicond. Sci. Technol. 8, 788 (1993)
34.12
34.13
go back to reference N.T. Gordon, I.M. Baker: In: Infrared Detectors and Emitters: Materials and Devices, ed. by P. Capper, C.T. Elliott (Kluwer Academic, Dordrecht 2001) p. 23 N.T. Gordon, I.M. Baker: In: Infrared Detectors and Emitters: Materials and Devices, ed. by P. Capper, C.T. Elliott (Kluwer Academic, Dordrecht 2001) p. 23
34.14
34.15
go back to reference L.J. Kozlowski, J. Montroy, K. Vural, W.E. Kleinhans: Proc. SPIE 3436, 162 (1998) L.J. Kozlowski, J. Montroy, K. Vural, W.E. Kleinhans: Proc. SPIE 3436, 162 (1998)
34.16
go back to reference M.B. Reine, A.K. Sood, T.J. Tredwell: Photovoltaic infrared detectros. In: Semiconductors and Semimetals, Vol. 18, ed. by R.K. Willardson, A.C. Beer (Academic, New York 1981) p. 201 M.B. Reine, A.K. Sood, T.J. Tredwell: Photovoltaic infrared detectros. In: Semiconductors and Semimetals, Vol. 18, ed. by R.K. Willardson, A.C. Beer (Academic, New York 1981) p. 201
34.17
go back to reference M.B. Reine: Photovoltaic detectors. In: Infrared Detectors and Emitters: Materials and Devices, Electronic Materials Ser., Vol. 8, ed. by P. Capper, C.T. Elliott (Springer, New York 2001) M.B. Reine: Photovoltaic detectors. In: Infrared Detectors and Emitters: Materials and Devices, Electronic Materials Ser., Vol. 8, ed. by P. Capper, C.T. Elliott (Springer, New York 2001)
34.18
go back to reference W.E. Tennant, D. Lee, M. Zandian, E. Piquette, M. Carmody: J. Electron. Mater. 37, 1406 (2008) W.E. Tennant, D. Lee, M. Zandian, E. Piquette, M. Carmody: J. Electron. Mater. 37, 1406 (2008)
34.19
go back to reference W.E. Tennant: J. Electron. Mater. 39, 1030 (2010) W.E. Tennant: J. Electron. Mater. 39, 1030 (2010)
34.20
go back to reference D.E. Lacklison, P. Capper: Semicond. Sci. Technol. 2, 33 (1987) D.E. Lacklison, P. Capper: Semicond. Sci. Technol. 2, 33 (1987)
34.21
go back to reference P.L. Polla, R.L. Aggarwal, D.A. Nelson, J.F. Shanley, M.B. Reine: Appl. Phys. Lett. 43, 941 (1983) P.L. Polla, R.L. Aggarwal, D.A. Nelson, J.F. Shanley, M.B. Reine: Appl. Phys. Lett. 43, 941 (1983)
34.22
go back to reference W.A. Radford, R.E. Kvaas, S.M. Johnson:Proc. IRIS Special Group Infrared Mater., Menlo Park (1986) W.A. Radford, R.E. Kvaas, S.M. Johnson:Proc. IRIS Special Group Infrared Mater., Menlo Park (1986)
34.23
go back to reference M.A. Kinch: Fundamentals of Infrared Detector Materials, Vol. TT76 (SPIE, Bellingham 2007) M.A. Kinch: Fundamentals of Infrared Detector Materials, Vol. TT76 (SPIE, Bellingham 2007)
34.24
go back to reference O.P. Agnihotri, C.A. Musca, L. Faraone: Semicond. Sci. Technol. 13, 839 (1998) O.P. Agnihotri, C.A. Musca, L. Faraone: Semicond. Sci. Technol. 13, 839 (1998)
34.25
go back to reference W.W. Anderson: Infrared Phys. 20, 353 (1980) W.W. Anderson: Infrared Phys. 20, 353 (1980)
34.26
go back to reference J.Y. Wong: IEEE Trans. Electron Devices 27, 48 (1980) J.Y. Wong: IEEE Trans. Electron Devices 27, 48 (1980)
34.27
go back to reference W.W. Anderson, K.J. Hoffman: J. Appl. Phys. 53, 9130 (1982) W.W. Anderson, K.J. Hoffman: J. Appl. Phys. 53, 9130 (1982)
34.28
34.29
go back to reference R.E. DeWames, J.G. Pasko, E.S. Yao, A.H.B. Vanderwyck, G.M. Williams: J. Vac. Sci. Technol. A6, 2655 (1988) R.E. DeWames, J.G. Pasko, E.S. Yao, A.H.B. Vanderwyck, G.M. Williams: J. Vac. Sci. Technol. A6, 2655 (1988)
34.30
go back to reference Y. Nemirovski, D. Rosenfeld, R. Adar, A. Kornfeld: J. Vac. Sci. Technol. A7, 528 (1989) Y. Nemirovski, D. Rosenfeld, R. Adar, A. Kornfeld: J. Vac. Sci. Technol. A7, 528 (1989)
34.31
go back to reference D. Rosenfeld, G. Bahir: IEEE Trans. Electron Devices 39, 1638 (1992) D. Rosenfeld, G. Bahir: IEEE Trans. Electron Devices 39, 1638 (1992)
34.32
go back to reference Y. Nemirovsky, R. Fastow, M. Meyassed, A. Unikovsky: J. Vac. Sci. Technol. B9(3), 1829 (1991) Y. Nemirovsky, R. Fastow, M. Meyassed, A. Unikovsky: J. Vac. Sci. Technol. B9(3), 1829 (1991)
34.33
go back to reference C.T. Elliott, N.T. Gordon, R.S. Hall, G.J. Crimes: J. Vac. Sci. Technol. A 8, 1251 (1990) C.T. Elliott, N.T. Gordon, R.S. Hall, G.J. Crimes: J. Vac. Sci. Technol. A 8, 1251 (1990)
34.34
go back to reference I.M. Baker, C.D. Maxey: J. Electron. Mater. 30(6), 682 (2003) I.M. Baker, C.D. Maxey: J. Electron. Mater. 30(6), 682 (2003)
34.35
go back to reference I.M. Baker, G.J. Crimes, C.K. Ard, M.D. Jenner, J.E. Parsons, R.A. Ballingall, C.T. Elliott: IEE Conf. Pub. 321, 78 (1990) I.M. Baker, G.J. Crimes, C.K. Ard, M.D. Jenner, J.E. Parsons, R.A. Ballingall, C.T. Elliott: IEE Conf. Pub. 321, 78 (1990)
34.36
go back to reference J. Schuster, E. Bellotti: J. Electron. Mater. 43(8), 2808 (2014) J. Schuster, E. Bellotti: J. Electron. Mater. 43(8), 2808 (2014)
34.37
go back to reference L.G. Hipwood, C.L. Jones, D.C. Walker, J. Shaw, P. Abbott, R.A. Catchpole, M. Ordish, C.D. Maxey, H.W. Lau, P. Knowles, M.C. Wilson: Proc. SPIE 6542, 65420I (2007) L.G. Hipwood, C.L. Jones, D.C. Walker, J. Shaw, P. Abbott, R.A. Catchpole, M. Ordish, C.D. Maxey, H.W. Lau, P. Knowles, M.C. Wilson: Proc. SPIE 6542, 65420I (2007)
34.38
go back to reference L.G. Hipwood, I.M. Baker, C.L. Jones, C. Maxey, H.W. Lau, J. Fitzmaurice, M. Wilson, P. Knowles: Proc. SPIE 6940, 69400G (2008) L.G. Hipwood, I.M. Baker, C.L. Jones, C. Maxey, H.W. Lau, J. Fitzmaurice, M. Wilson, P. Knowles: Proc. SPIE 6940, 69400G (2008)
34.39
go back to reference Y. Nemirovski, A. Unikovsky: J. Vac. Sci. Technol. B10, 1602 (1992) Y. Nemirovski, A. Unikovsky: J. Vac. Sci. Technol. B10, 1602 (1992)
34.40
go back to reference M.A. Kinch, R.L. Strong, C.A. Schaake: J. Electron. Mater. 42(11), 3243–3251 (2013) M.A. Kinch, R.L. Strong, C.A. Schaake: J. Electron. Mater. 42(11), 3243–3251 (2013)
34.41
go back to reference R.L. Strong, M.A. Kinch, J.M. Armstrong: Proc. SPIE 8704, 87042O (2013) R.L. Strong, M.A. Kinch, J.M. Armstrong: Proc. SPIE 8704, 87042O (2013)
34.43
go back to reference P. Capper, T. Tung, L. Colombo: In: Narrow-Gap II-IV Compounds for Optoelectronic and Electromagnetic Applications, ed. by P. Capper (Chapman Hall, London 1997) p. 30 P. Capper, T. Tung, L. Colombo: In: Narrow-Gap II-IV Compounds for Optoelectronic and Electromagnetic Applications, ed. by P. Capper (Chapman Hall, London 1997) p. 30
34.44
go back to reference I.M. Baker, G.J. Crimes, J.E. Parsons, E.S. O’Keefe: Proc. SPIE 2269, 636 (1994) I.M. Baker, G.J. Crimes, J.E. Parsons, E.S. O’Keefe: Proc. SPIE 2269, 636 (1994)
34.45
go back to reference S.M. Johnson, J.A. Vigil, J.B. James, C. Cockrum, W. Konkel, M. Kalisher, R. Risser, T. Tung, W. Hamilton, W. Ahlgren: J. Electron. Mater. 22, 835 (1993) S.M. Johnson, J.A. Vigil, J.B. James, C. Cockrum, W. Konkel, M. Kalisher, R. Risser, T. Tung, W. Hamilton, W. Ahlgren: J. Electron. Mater. 22, 835 (1993)
34.46
go back to reference M.V. Blackman, D.E. Charlton, M.D. Jenner, D.R. Purdy, J.T. Wotherspoon, C.T. Elliott, A.M. White: Electron. Lett. 23, 978 (1987) M.V. Blackman, D.E. Charlton, M.D. Jenner, D.R. Purdy, J.T. Wotherspoon, C.T. Elliott, A.M. White: Electron. Lett. 23, 978 (1987)
34.47
go back to reference S. Margalit, Y. Nemirovsky, I. Rotstein: J. Appl. Phys. 50, 6386 (1979) S. Margalit, Y. Nemirovsky, I. Rotstein: J. Appl. Phys. 50, 6386 (1979)
34.48
go back to reference A. Kolodny, I. Kidron: IEEE Trans. Electron Devices ED-27, 37 (1980) A. Kolodny, I. Kidron: IEEE Trans. Electron Devices ED-27, 37 (1980)
34.49
go back to reference L.O. Bubulac, W.E. Tennant, R.A. Riedel, T.J. Magee: J. Vac. Sci. Technol. 21, 251 (1982) L.O. Bubulac, W.E. Tennant, R.A. Riedel, T.J. Magee: J. Vac. Sci. Technol. 21, 251 (1982)
34.50
go back to reference L.O. Bubulac, C.R. Viswanathan: J. Cryst. Growth 123, 555 (1992) L.O. Bubulac, C.R. Viswanathan: J. Cryst. Growth 123, 555 (1992)
34.51
go back to reference J. Syz, J.D. Beck, T.W. Orient, H.F. Schaake: J. Vac. Sci. Technol. A7, 396 (1989) J. Syz, J.D. Beck, T.W. Orient, H.F. Schaake: J. Vac. Sci. Technol. A7, 396 (1989)
34.52
34.53
go back to reference J. White, R. Pal, J.M. Dell, C.A. Musca, J. Antoszewski, L. Faraone, P. Burke: J. Electron. Mater. 30(6), 762 (2001) J. White, R. Pal, J.M. Dell, C.A. Musca, J. Antoszewski, L. Faraone, P. Burke: J. Electron. Mater. 30(6), 762 (2001)
34.54
go back to reference I.M. Baker, R.A. Ballingall: Proc. SPIE 510, 210 (1985) I.M. Baker, R.A. Ballingall: Proc. SPIE 510, 210 (1985)
34.55
go back to reference P. Tribulet, J.-P. Chatard, P. Costa, S. Paltrier: J. Electron. Mater. 30(6), 574 (2001) P. Tribulet, J.-P. Chatard, P. Costa, S. Paltrier: J. Electron. Mater. 30(6), 574 (2001)
34.56
go back to reference J. Wenisch, H. Bitterlich, M. Bruder, P. Fries, R. Wollrab, J. Wendler, R. Breiter, J. Ziegler: J. Electron. Mater. 42(11), 31861 (2013) J. Wenisch, H. Bitterlich, M. Bruder, P. Fries, R. Wollrab, J. Wendler, R. Breiter, J. Ziegler: J. Electron. Mater. 42(11), 31861 (2013)
34.57
go back to reference O. Gravrand, G. Destefanis, S. Bisotto, N. Baier, J. Rothman, L. Mollard, D. Brellier, L. Rubaldo, A. Kerlain, V. Destefanis, M. Vuillermet: J. Electron. Mater. 42(11), 3349 (2013) O. Gravrand, G. Destefanis, S. Bisotto, N. Baier, J. Rothman, L. Mollard, D. Brellier, L. Rubaldo, A. Kerlain, V. Destefanis, M. Vuillermet: J. Electron. Mater. 42(11), 3349 (2013)
34.58
go back to reference O.K. Wu, T.J. deLyon, R.D. Rajavel, J.E. Jensen: Molecular beam epitaxy of HgCdTe. In: Narrow-Gap II-IV Compounds for Optoelectronic and Electromagnetic Applications, ed. by P. Capper (Chapman Hall, London 1997) O.K. Wu, T.J. deLyon, R.D. Rajavel, J.E. Jensen: Molecular beam epitaxy of HgCdTe. In: Narrow-Gap II-IV Compounds for Optoelectronic and Electromagnetic Applications, ed. by P. Capper (Chapman Hall, London 1997)
34.59
go back to reference C.D. Maxey, J.P. Camplin, I.T. Guilfoy, J. Gardener, R.A. Lockett, C.L. Jones, P. Capper, M. Houlton, N.T. Gordon: J. Electron. Mater. 32(7), 656 (2003) C.D. Maxey, J.P. Camplin, I.T. Guilfoy, J. Gardener, R.A. Lockett, C.L. Jones, P. Capper, M. Houlton, N.T. Gordon: J. Electron. Mater. 32(7), 656 (2003)
34.60
go back to reference J.M. Arias, J.G. Pasko, M. Zandian, S.H. Shin, G.M. Williams, L.O. Bubulac, R.-E. DeWames, W.E. Tennant: Appl. Phys. Letts. 62, 976 (1993) J.M. Arias, J.G. Pasko, M. Zandian, S.H. Shin, G.M. Williams, L.O. Bubulac, R.-E. DeWames, W.E. Tennant: Appl. Phys. Letts. 62, 976 (1993)
34.61
34.62
go back to reference T. Tung, M.H. Kalisher, M.H. Stevens, P.E. Herning: Mater. Res. Soc. Symp. Proc. 90, 321 (1987) T. Tung, M.H. Kalisher, M.H. Stevens, P.E. Herning: Mater. Res. Soc. Symp. Proc. 90, 321 (1987)
34.63
go back to reference C.C. Wang: J. Vac. Sci. Technol. B9, 740 (1991) C.C. Wang: J. Vac. Sci. Technol. B9, 740 (1991)
34.64
go back to reference G.N. Pulz, P.W. Norton, E.E. Krueger, M.B. Reine: J. Vac. Sci. Technol. B9, 1724 (1991) G.N. Pulz, P.W. Norton, E.E. Krueger, M.B. Reine: J. Vac. Sci. Technol. B9, 1724 (1991)
34.65
go back to reference P.W. Norton, P. LoVecchio, G.N. Pultz, J. Hughes, T. Robertson, V. Lukach, K. Wong: Proc. SPIE 2228, 73 (1994) P.W. Norton, P. LoVecchio, G.N. Pultz, J. Hughes, T. Robertson, V. Lukach, K. Wong: Proc. SPIE 2228, 73 (1994)
34.66
34.67
go back to reference M. Carmody, A. Yulius, D. Edwall, E. Piquette, R. Jacobs, D. Benson, A. Stoltz, J. Markunas, A. Almeida, J. Arias: J. Electron. Mater. 41(10), 2719 (2012) M. Carmody, A. Yulius, D. Edwall, E. Piquette, R. Jacobs, D. Benson, A. Stoltz, J. Markunas, A. Almeida, J. Arias: J. Electron. Mater. 41(10), 2719 (2012)
34.68
go back to reference J.M. Arias, S.H. Shin, E.M. Gertner: J. Cryst. Growth 86, 362 (1988) J.M. Arias, S.H. Shin, E.M. Gertner: J. Cryst. Growth 86, 362 (1988)
34.69
go back to reference J.B. Varesi, R.E. Bornfreund, A.C. Childs, W.A. Radford, K.D. Maranowski, J.M. Peterson, S.M. Johnson, L.M. Giegerich, T.J. de Lyon, J.E. Jensen: J. Electron. Mater. 30(6), 566 (2001) J.B. Varesi, R.E. Bornfreund, A.C. Childs, W.A. Radford, K.D. Maranowski, J.M. Peterson, S.M. Johnson, L.M. Giegerich, T.J. de Lyon, J.E. Jensen: J. Electron. Mater. 30(6), 566 (2001)
34.70
go back to reference G. Bostrup, K.L. Hess, J. Ellsworth, D. Cooper, R. Haines: J. Electron. Mater. 30(6), 560 (2001) G. Bostrup, K.L. Hess, J. Ellsworth, D. Cooper, R. Haines: J. Electron. Mater. 30(6), 560 (2001)
34.71
go back to reference K. Vural, L.J. Kozlowski, D.E. Cooper, C.A. Chen, G.L. Bostrup, C. Cabelli, J.M. Arias, J. Bajaj, K.W. Hodapp, D.N.B. Hall, W.E. Kleinhans, G.G. Price, J.A. Pinter: Proc. SPIE 3698, 24 (1999) K. Vural, L.J. Kozlowski, D.E. Cooper, C.A. Chen, G.L. Bostrup, C. Cabelli, J.M. Arias, J. Bajaj, K.W. Hodapp, D.N.B. Hall, W.E. Kleinhans, G.G. Price, J.A. Pinter: Proc. SPIE 3698, 24 (1999)
34.72
go back to reference R. Driggers, R. Vollmerhausen, J.P. Reynolds, J. Fanning, G.C. Holst: Opt. Eng. 51(6), 063202 (2012) R. Driggers, R. Vollmerhausen, J.P. Reynolds, J. Fanning, G.C. Holst: Opt. Eng. 51(6), 063202 (2012)
34.73
go back to reference K. McEwen, D. Jeckells, S. Bains, H. Weller: Proc. SPIE 9451, 94512D (2015) K. McEwen, D. Jeckells, S. Bains, H. Weller: Proc. SPIE 9451, 94512D (2015)
34.74
go back to reference C.M. Sparrow: Astrophys. J. 44, 76–87 (1916) C.M. Sparrow: Astrophys. J. 44, 76–87 (1916)
34.75
go back to reference Y. Reibel, N. Péré-Laperne, L. Rubaldo, T. Augey, G. Decaens, V. Badet, L. Baud, J. Roumegoux, A. Kessler, P. Maillart, N. Ricard, O. Pacaud, G. Destéfanis: Proc. SPIE 9451, 94512E (2015) Y. Reibel, N. Péré-Laperne, L. Rubaldo, T. Augey, G. Decaens, V. Badet, L. Baud, J. Roumegoux, A. Kessler, P. Maillart, N. Ricard, O. Pacaud, G. Destéfanis: Proc. SPIE 9451, 94512E (2015)
34.76
go back to reference E.C. Piquette, W. McLevige, J. Auyeung, A. Wong: Proc. SPIE 9154, 91542H (2014) E.C. Piquette, W. McLevige, J. Auyeung, A. Wong: Proc. SPIE 9154, 91542H (2014)
34.77
go back to reference P. Thorne, H. Weller, L.G. Hipwood: Proc. SPIE 8353, 83532J (2012) P. Thorne, H. Weller, L.G. Hipwood: Proc. SPIE 8353, 83532J (2012)
34.79
go back to reference J.M. Robinson, M. Kinch, D. Littlejohn, K. Jeppson: Proc. SPIE 9100, 91000I (2014) J.M. Robinson, M. Kinch, D. Littlejohn, K. Jeppson: Proc. SPIE 9100, 91000I (2014)
34.80
go back to reference W.E. Tennant, D.J. Gulbransen, A. Roll, M. Carmody, D. Edwall, A. Julius, P. Dreiske, A. Chen, W. McLevige, S. Freeman, D. Lee, D.E. Cooper, E. Piquette: J. Electron. Mater. 43(8), 3041 (2014) W.E. Tennant, D.J. Gulbransen, A. Roll, M. Carmody, D. Edwall, A. Julius, P. Dreiske, A. Chen, W. McLevige, S. Freeman, D. Lee, D.E. Cooper, E. Piquette: J. Electron. Mater. 43(8), 3041 (2014)
34.81
go back to reference L. Pillans, R.M. Ash, L. Hipwood, P. Knowles: Proc. SPIE 8353, 83532W (2012) L. Pillans, R.M. Ash, L. Hipwood, P. Knowles: Proc. SPIE 8353, 83532W (2012)
34.82
34.83
go back to reference C.T. Elliott, N.T. Gordon, A.M. White: Appl. Phys. Lett. 74, 2881 (1999) C.T. Elliott, N.T. Gordon, A.M. White: Appl. Phys. Lett. 74, 2881 (1999)
34.84
go back to reference C.T. Elliott, T. Ashley: Electron. Lett. 21, 451 (1985) C.T. Elliott, T. Ashley: Electron. Lett. 21, 451 (1985)
34.85
go back to reference T.N. Casselman, G.R. Chapman, K. Kosai:US Workshop Phys. Chem. MCT II-IV Compd., Dallas (1991) T.N. Casselman, G.R. Chapman, K. Kosai:US Workshop Phys. Chem. MCT II-IV Compd., Dallas (1991)
34.86
go back to reference R.D. Rajavel, D.M. Jamba, J.E. Jensen, O.K. Wu, C. Le Beau, J.A. Wilson, E. Patten, K. Kosai, J. Johnson, J. Rosbeck, P. Goetz, S.M. Johnson: J. Electron. Mater. 26, 476 (1997) R.D. Rajavel, D.M. Jamba, J.E. Jensen, O.K. Wu, C. Le Beau, J.A. Wilson, E. Patten, K. Kosai, J. Johnson, J. Rosbeck, P. Goetz, S.M. Johnson: J. Electron. Mater. 26, 476 (1997)
34.87
go back to reference R.D. Rajavel, D.M. Jamba, J.E. Jensen, O.K. Wu, P.D. Brewer, J.A. Wilson, J.L. Johnson, E.A. Patten, K. Kasai, J.T. Caulfield, P.M. Goetz: J. Electron. Mater. 27, 747 (1998) R.D. Rajavel, D.M. Jamba, J.E. Jensen, O.K. Wu, P.D. Brewer, J.A. Wilson, J.L. Johnson, E.A. Patten, K. Kasai, J.T. Caulfield, P.M. Goetz: J. Electron. Mater. 27, 747 (1998)
34.88
go back to reference M.B. Reine, A. Hairston, P. O’Dette, S.P. Tobin, F.T. Smith, B.L. Musicant, P. Mitra, F.C. Case: Proc. SPIE 3379, 200 (1998) M.B. Reine, A. Hairston, P. O’Dette, S.P. Tobin, F.T. Smith, B.L. Musicant, P. Mitra, F.C. Case: Proc. SPIE 3379, 200 (1998)
34.89
go back to reference W.E. Tennant, M. Thomas, L.J. Kozlowski, W.V. McLevige, D.D. Edwall, M. Zandian, K. Spariosu, G. Hildebrandt, V. Gil, P. Ely, M. Muzilla, A. Stoltz, J.H. Dinan: J. Electron. Mater. 30(6), 590 (2001) W.E. Tennant, M. Thomas, L.J. Kozlowski, W.V. McLevige, D.D. Edwall, M. Zandian, K. Spariosu, G. Hildebrandt, V. Gil, P. Ely, M. Muzilla, A. Stoltz, J.H. Dinan: J. Electron. Mater. 30(6), 590 (2001)
34.90
go back to reference W. Cabanski, R. Breiter, R. Koch, K.-H. Mauk, W. Rode, J. Ziegler, H. Schneider, M. Walther, R. Oelmaier: Proc. SPIE 4369, 547 (2001) W. Cabanski, R. Breiter, R. Koch, K.-H. Mauk, W. Rode, J. Ziegler, H. Schneider, M. Walther, R. Oelmaier: Proc. SPIE 4369, 547 (2001)
34.91
go back to reference M.F. Vilela, K.R. Olsson, E.M. Norton, J.M. Peterson, K. Rybnicek, D.R. Rhiger, C.W. Fulk, J.W. Bangs, D.D. Lofgreen, S.M. Johnson: J. Electron. Mater. 42(11), 3231 (2013) M.F. Vilela, K.R. Olsson, E.M. Norton, J.M. Peterson, K. Rybnicek, D.R. Rhiger, C.W. Fulk, J.W. Bangs, D.D. Lofgreen, S.M. Johnson: J. Electron. Mater. 42(11), 3231 (2013)
34.92
go back to reference J.P.G. Price, C.L. Jones, L.G. Hipwood, C.J. Shaw, P. Abbot, C.D. Maxey, H.W. Lau, J. Fitzmaurice, R.A. Catchpole, M. Ordish, P. Thorne, H.J. Weller, R.C. Mistry, K. Hoade, A. Bradford, D. Owton, P. Knowles: Proc. SPIE 6940, 69402S (2008) J.P.G. Price, C.L. Jones, L.G. Hipwood, C.J. Shaw, P. Abbot, C.D. Maxey, H.W. Lau, J. Fitzmaurice, R.A. Catchpole, M. Ordish, P. Thorne, H.J. Weller, R.C. Mistry, K. Hoade, A. Bradford, D. Owton, P. Knowles: Proc. SPIE 6940, 69402S (2008)
34.93
go back to reference P. Abbott, L. Pillans, P. Knowles, R.K. McEwen: Proc. SPIE 7660, 766035 (2010) P. Abbott, L. Pillans, P. Knowles, R.K. McEwen: Proc. SPIE 7660, 766035 (2010)
34.94
go back to reference J.D. Beck, C.-F. Wan, M.A. Kinch, J.E. Robinson: Proc. SPIE 4454, 188 (2001) J.D. Beck, C.-F. Wan, M.A. Kinch, J.E. Robinson: Proc. SPIE 4454, 188 (2001)
34.95
go back to reference I.M. Baker, S. Duncan, J. Copley: Proc. SPIE 5406, 133 (2004) I.M. Baker, S. Duncan, J. Copley: Proc. SPIE 5406, 133 (2004)
34.96
go back to reference J. Rothman, L. Mollard, S. Gout, S. Bonnefond, J. Wlassow: J. Electron. Mater. 40(8), 1757 (2011) J. Rothman, L. Mollard, S. Gout, S. Bonnefond, J. Wlassow: J. Electron. Mater. 40(8), 1757 (2011)
34.97
go back to reference J.D. Beck, R. Scritchfield, P. Mitra, W. Sullivan III, A.D. Gleckler, R. Strittmatter, R. J. M. Martin: Advanced Photon counting techniques, SPIE Conf. Series, 8033 (2011) J.D. Beck, R. Scritchfield, P. Mitra, W. Sullivan III, A.D. Gleckler, R. Strittmatter, R. J. M. Martin: Advanced Photon counting techniques, SPIE Conf. Series, 8033 (2011)
34.98
go back to reference M.A. Kinch, I.M. Baker: HgCdTe electron avalanche photodiodes. In: Mercury Cadmium Telluride – Growth, Properties and Applications, ed. by P. Capper, J. Garland (Wiley, Chichester 2011) p. 493 M.A. Kinch, I.M. Baker: HgCdTe electron avalanche photodiodes. In: Mercury Cadmium Telluride – Growth, Properties and Applications, ed. by P. Capper, J. Garland (Wiley, Chichester 2011) p. 493
34.99
go back to reference J.D. Beck, R. Woodal, M. Scritchfield, M. Ohlson, L. Wood, P. Mitra, J. Robinson: J. Electron. Mater. 37, 1334 (2008) J.D. Beck, R. Woodal, M. Scritchfield, M. Ohlson, L. Wood, P. Mitra, J. Robinson: J. Electron. Mater. 37, 1334 (2008)
34.100
go back to reference J. Rothman, L. Mollard, S. Bosson, G. Vojetta, K. Foubert, S. Gatti, G. Bonnouvrier, F. Salveti, A. Kerlain, O. Pacaud: J. Electron. Mater. 41(10), 2928 (2012) J. Rothman, L. Mollard, S. Bosson, G. Vojetta, K. Foubert, S. Gatti, G. Bonnouvrier, F. Salveti, A. Kerlain, O. Pacaud: J. Electron. Mater. 41(10), 2928 (2012)
34.101
go back to reference G. Finger, I.M. Baker, D. Alvarez, D. Ives, L. Mehrgan, M. Meyer, J. Stegmeier: Optical and IR telescope instrumentation and detectors, Scientific Detector Workshop, Florence (2013) G. Finger, I.M. Baker, D. Alvarez, D. Ives, L. Mehrgan, M. Meyer, J. Stegmeier: Optical and IR telescope instrumentation and detectors, Scientific Detector Workshop, Florence (2013)
34.102
go back to reference D. Atkinson, D. Hall, C. Baranec, I. Baker, S. Jacobson, R. Riddle: Proc. SPIE 9154, 915419 (2014) D. Atkinson, D. Hall, C. Baranec, I. Baker, S. Jacobson, R. Riddle: Proc. SPIE 9154, 915419 (2014)
34.103
go back to reference I.M. Baker, P. Thorne, J. Henderson, J. Copley, D. Humphreys, A. Millar: Proc. SPIE 6206, 620608 (2006) I.M. Baker, P. Thorne, J. Henderson, J. Copley, D. Humphreys, A. Millar: Proc. SPIE 6206, 620608 (2006)
34.104
go back to reference I.M. Baker, D. Owton, K. Trundle, K. Thorne, P. Storie, P. Oakley, J. Copley: Proc. SPIE 6940, 69402L (2008) I.M. Baker, D. Owton, K. Trundle, K. Thorne, P. Storie, P. Oakley, J. Copley: Proc. SPIE 6940, 69402L (2008)
34.105
go back to reference D. Marr: Vision (W.H.Freeman, New York 1982) D. Marr: Vision (W.H.Freeman, New York 1982)
34.106
go back to reference M. Masie, P. McCarley, J.P. Curzan: Proc. SPIE 1961, 17 (1993) M. Masie, P. McCarley, J.P. Curzan: Proc. SPIE 1961, 17 (1993)
34.107
34.108
go back to reference C.R. Baxter, M.A. Massie, P.L. McCarley, M.E. Couture: Proc. SPIE 4369, 129 (2001) C.R. Baxter, M.A. Massie, P.L. McCarley, M.E. Couture: Proc. SPIE 4369, 129 (2001)
34.109
go back to reference N.T. Gordon: Emission devices. In: Narrow-Gap II-IV Compounds for Optoelectronic and Electromagnetic Applications, ed. by Peter Capper (Chapman Hall, London 1997) p. 486 N.T. Gordon: Emission devices. In: Narrow-Gap II-IV Compounds for Optoelectronic and Electromagnetic Applications, ed. by Peter Capper (Chapman Hall, London 1997) p. 486
34.110
go back to reference P. Bouchut, G. Destefanis, J.P. Chamonal, A. Million, B. Pelliciari, J. Piaguet: J. Vac. Sci. Technol. B 9, 1794 (1991) P. Bouchut, G. Destefanis, J.P. Chamonal, A. Million, B. Pelliciari, J. Piaguet: J. Vac. Sci. Technol. B 9, 1794 (1991)
34.111
go back to reference T. Ashley, C.T. Elliott, N.T. Gordon, R.S. Hall, A.D. Johnson, G.J. Pryce: Infrared Phys. Technol. 36, 1037 (1995) T. Ashley, C.T. Elliott, N.T. Gordon, R.S. Hall, A.D. Johnson, G.J. Pryce: Infrared Phys. Technol. 36, 1037 (1995)
34.112
go back to reference R. Zucca, J. Bajaj, E.R. Blazewski: J. Vac. Sci. Technol. A 6, 2725 (1988) R. Zucca, J. Bajaj, E.R. Blazewski: J. Vac. Sci. Technol. A 6, 2725 (1988)
34.113
go back to reference J.R. Meyer, I. Vurgaftman: Reduced-dimensionality HgTe-CdTe for the infrared. In: Infrared Detectors and Emitters: Materials and Devices, Electronic Materials, Vol. 8, ed. by P. Capper, C.T. Elliott (Kluwer, New York 2001) J.R. Meyer, I. Vurgaftman: Reduced-dimensionality HgTe-CdTe for the infrared. In: Infrared Detectors and Emitters: Materials and Devices, Electronic Materials, Vol. 8, ed. by P. Capper, C.T. Elliott (Kluwer, New York 2001)
Metadata
Title
II-VI Narrow Bandgap Semiconductors: Optoelectronics
Author
Ian M. Baker
Copyright Year
2017
Publisher
Springer International Publishing
DOI
https://doi.org/10.1007/978-3-319-48933-9_34