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2019 | OriginalPaper | Chapter

16. Increasing the Reliability of Device/Product Designs

Author : J. W. McPherson

Published in: Reliability Physics and Engineering

Publisher: Springer International Publishing

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Abstract

Design engineers are continually asked reliability questions such as: (1) how long is your newly designed device/product expected to last and (2) how can you make cost-effective design changes to improve the reliability robustness of the device? Often the designer will attempt to answer these questions by stating a safety factor v which was used for a design:

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A REF = 2 means that the improved design should last 2 times longer than the original design, a REF = 3 means the improved design should last 3 times longer than the original design, etc.

Recall that the stress-level σ_design must be greater than the yield-strength σ_yield for creep to occur.

The value of n_creep = 5 is used so often in creep analysis that it is generally referred to as the literature as the five-power-law for creep behavior.

Title: Increasing the Reliability of Device/Product Designs
Author: J. W. McPherson
Publisher: Springer International Publishing
Book: Reliability Physics and Engineering
Print ISBN: 978-3-319-93682-6

Electronic ISBN: 978-3-319-93683-3

Copyright Year: 2019
DOI: https://doi.org/10.1007/978-3-319-93683-3_16