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Journal of Materials Science: Materials in Electronics

Ion-beam exposure on PAM surface according to molecular concentration for application to liquid-crystal device

  • 01-05-2023
Published in:
Authors
Dong Wook Lee
Dong Hyun Kim
Jin Young Oh
Jonghoon Won
Da Bin Yang
Hae-Chang Jeong
Dae-Shik Seo
Published in
Journal of Materials Science: Materials in Electronics | Issue 13/2023

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Abstract

The article delves into the advanced surface treatment of alignment layers for liquid-crystal devices using ion-beam exposure on polyacrylamide (PAM) surfaces. It examines the impact of PAM molecular concentration on film state modifications and the subsequent effects on liquid-crystal alignment and device performance. Through various characterization techniques, the study reveals that higher molecular concentrations of PAM lead to stronger surface modifications and better liquid-crystal alignment. The findings demonstrate that ion-beam exposure can enhance the electro-optical performance of liquid-crystal devices, making this approach a promising alternative to traditional rubbing processes.
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previous article Uncoupling nanoparticle geometry from material properties for improved hole injection at submonolayer nanoparticle electrode interlayers in organic hole-only devices
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Title
Ion-beam exposure on PAM surface according to molecular concentration for application to liquid-crystal device
Authors
Dong Wook Lee
Dong Hyun Kim
Jin Young Oh
Jonghoon Won
Da Bin Yang
Hae-Chang Jeong
Dae-Shik Seo
Publication date
01-05-2023
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 13/2023
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-023-10523-6
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