Issue 6/2010
2009 International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP)
Content (41 Articles)
Study of Semiconductor Multilayer Structures by Cathodoluminescence and Electron Probe Microanalysis
M.V. Zamoryanskaya, Ya.V. Kuznetsova, T.B. Popova, A.A. Shakhmin, D.A. Vinokurov, A.N. Trofimov
Study of Metal Contamination in CMOS Image Sensors by Dark-Current and Deep-Level Transient Spectroscopies
F. Domengie, J. L. Regolini, D. Bauza
Influence of Operating Conditions on Quantum Cascade Laser Temperature
Kamil Pierściński, Dorota Pierścińska, Kamil Kosiel, Anna Szerling, Maciej Bugajski
Evolution of Optical and Mechanical Properties of Semiconductors over 40 Years
Sergei Pyshkin, John Ballato
Accelerated Light-Induced Degradation (ALID) for Monitoring of Defects in PV Silicon Wafers and Solar Cells
Marshall Wilson, Piotr Edelman, Alexandre Savtchouk, John D’Amico, Andrew Findlay, Jacek Lagowski
Correlation Between Oxygen Precipitation and Extended Defects in Czochralski Silicon: Investigation by Means of Scanning Infrared Microscopy
Yuheng Zeng, Xiangyang Ma, Jiahe Chen, Deren Yang
Defect-Related White-Light Emission from ZnO in an n-Mg0.2Zn0.8O/n-ZnO/SiO x Heterostructure on n-Si
Peiliang Chen, Xiangyang Ma, Yuanyuan Zhang, Dongsheng Li, Deren Yang
The Use of Spatial Analysis Techniques in Defect and Nanostructure Studies
M.A. Moram, U.E. Gabbai, T.C. Sadler, M.J. Kappers, R.A. Oliver
LBIC and Reflectance Mapping of Multicrystalline Si Solar Cells
B. Moralejo, M. A. González, J. Jiménez, V. Parra, O. Martínez, J. Gutiérrez, O. Charro
Effect on Ordering of the Growth of GaInP Layers on (111)-GaAs Faces
O. Martínez, V. Hortelano, J. Jiménez, V. Parra, C. Pelosi, G. Attolini, T. Prutskij
Optical and Structural Properties of In0.08GaN/In0.02GaN Multiple Quantum Wells Grown at Different Temperatures and with Different Indium Supplies
U. Zeimer, U. Jahn, V. Hoffmann, M. Weyers, M. Kneissl
Electrical and Optical Properties of Stacking Faults in 4H-SiC Devices
Bin Chen, Jun Chen, Takashi Sekiguchi, Takasumi Ohyanagi, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura
Cathodoluminescence Study of InP Photonic Structures Fabricated by Dry Etching
R. Chanson, A. Martin, M. Avella, J. Jiménez, F. Pommereau, J. P. Landesman, A. Rhallabi
Evaluation of Stress and Crystal Quality in Si During Shallow Trench Isolation by UV-Raman Spectroscopy
Daisuke Kosemura, Maki Hattori, Tetsuya Yoshida, Toshikazu Mizukoshi, Atsushi Ogura
Quantitative Photoelastic Characterization of Residual Strains in Grains of Multicrystalline Silicon
Masayuki Fukuzawa, Masayoshi Yamada, Md. Rafiqul Islam, Jun Chen, Takashi Sekiguchi
Detailed Analysis of Temperature Characteristics of an InGaP/InGaAs/Ge Triple-Junction Solar Cell
Kensuke Nishioka, Tsuyoshi Sueto, Masaki Uchida, Yasuyuki Ota
Imaging Catastrophic Optical Mirror Damage in High-Power Diode Lasers
Mathias Ziegler, Jens W. Tomm, Ute Zeimer, Thomas Elsaesser
Threading Screw Dislocations in 4H-SiC Wafer Observed by the Weak-Beam Method in Bragg-Case X-ray Topography
Hirotaka Yamaguchi, Hirofumi Matsuhata
Enhancement of Defect Production Rates in n-Type Silicon by Hydrogen Implantation Near 270 K
Yutaka Tokuda, Youichi Nagae, Hitoshi Sakane, Jyoji Ito
Defect Imaging in Laser Diodes by Mapping Their Near-Infrared Emission
Jens W. Tomm, Mathias Ziegler, Heiko Kissel, Jens Biesenbach
Structural Characterization of Doped GaSb Single Crystals by X-ray Topography
M. G. Hönnicke, I. Mazzaro, J. Manica, E. Benine, E. M. da Costa, B. A. Dedavid, C. Cusatis, X. R. Huang
Observation on Defects in Poly-Si Films Prepared by RTCVD Under Nonideal Conditions
Bin Ai, Hui Shen, You-Jun Deng, Chao Liu, Xue-Qin Liang
X-ray Diffraction Imaging of Improved Bulk-Grown CdZnTe(211) and Its Comparison with Epitaxially Grown CdTe Buffer Layers on Si and Ge Substrates
J. K. Markunas, L. A. Almeida, R. N. Jacobs, J. Pellegrino, S. B. Qadri, N. Mahadik, J. Sanghera
Diffraction Contrast of Threading Dislocations in GaN and 4H-SiC Epitaxial Layers Using Electron Channeling Contrast Imaging
M. E. Twigg, Y. N. Picard, J. D. Caldwell, C. R. Eddy Jr., M. A. Mastro, R. T. Holm, P. G. Neudeck, A. J. Trunek, J. A. Powell
Photoluminescence Analysis of Iron Contamination Effect in Multicrystalline Silicon Wafers for Solar Cells
Michio Tajima, Masatoshi Ikebe, Yoshio Ohshita, Atsushi Ogura
Investigation of Leakage Current of AlGaN/GaN HEMTs Under Pinch-Off Condition by Electroluminescence Microscopy
Martina Baeumler, Frank Gütle, Vladimir Polyakov, Markus Cäsar, Michael Dammann, Helmer Konstanzer, Wilfried Pletschen, Wolfgang Bronner, Rüdiger Quay, Patrick Waltereit, Michael Mikulla, Oliver Ambacher, Franck Bourgeois, Reza Behtash, Klaus J. Riepe, Paul J. van der Wel, Jos Klappe, Thomas Rödle
Effects of Chemical Treatment on the Luminescence of ZnO
B. Dierre, X. L. Yuan, N. Armani, F. Fabbri, G. Salviati, K. Ueda, T. Sekiguchi
Classification of Energy Levels in Quantum Dot Structures by Depleted Layer Spectroscopy
M. Kaniewska, O. Engström, M. Kaczmarczyk
Electroluminescence Spectral Imaging of Extended Defects in 4H-SiC
A.J. Giles, J.D. Caldwell, R.E. Stahlbush, B.A. Hull, N.A. Mahadik, O.J. Glembocki, K.D. Hobart, K.X. Liu
A Spectrum Image Cathodoluminescence Study of Dislocations in Si-Doped Liquid-Encapsulated Czochralski GaAs Crystals
M.A. González, O. Martínez, J. Jiménez, C. Frigeri, J.L. Weyher
Imaging of Metal Impurities in Silicon by Luminescence Spectroscopy and Synchrotron Techniques
Martin C. Schubert, Jonas Schön, Paul Gundel, Holger Habenicht, Wolfram Kwapil, Wilhelm Warta
Ion-Implantation Control of Ferromagnetism in (Ga,Mn)As Epitaxial Layers
O. Yastrubchak, J. Z. Domagala, J. Sadowski, M. Kulik, J. Zuk, A. L. Toth, R. Szymczak, T. Wosinski
Nucleation Mechanism of 6H-SiC Polytype Inclusions Inside 15R-SiC Crystals
Yu Zhang, Hui Chen, Gloria Choi, Balaji Raghothamachar, Michael Dudley, James H. Edgar, Krzysztof Grasza, Emil Tymicki, Lihua Zhang, Dong Su, Yimei Zhu
Cathodoluminescence Study of Orientation-Patterned GaAs Crystals for Nonlinear Optics
O. Martínez, M. Avella, V. Hortelano, J. Jiménez, C. Lynch, D. Bliss
Effects of Crystal-Induced Optical Incoherence in Electro-Optic Field Sensors
A. Garzarella, S. B. Qadri, Dong Ho Wu
Determination of Piezoelectric Fields Across InGaN/GaN Quantum Wells by Means of Electron Holography
Masashi Deguchi, Shigeyasu Tanaka, Takayoshi Tanji
Electron Scattering Mechanism of FTO Films Grown by Spray Pyrolysis Method
Minoru Oshima, Kenji Yoshino
Synchrotron X-Ray Topography Study of Structural Defects and Strain in Epitaxial Structures of Yb- and Tm-Doped Potassium Rare-Earth Double Tungstates and Their Influence on Laser Performance
B. Raghothamachar, J.J. Carvajal, M.C. Pujol, X. Mateos, R. Solé, M. Aguiló, F. Díaz, M. Dudley