Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

2023 JETTA Reviewers

An End-to-End Mutually Exclusive Autoencoder Method for Analog Circuit Fault Diagnosis

Yuling Shang, Songyi Wei, Chunquan Li, Xiaojing Ye, Lizhen Zeng, Wei Hu, Xiang He, Jinzhuo Zhou

A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements

Zhengfeng Huang, Zishuai Li, Liting Sun, Huaguo Liang, Tianming Ni, Aibin Yan

General Fault and Soft-Error Tolerant Phase-Locked Loop by Enhanced TMR using A Synchronization-before-Voting Scheme

Shun-Hua Yang, Shi-Yu Huang

A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches

Hui Xu, Xuewei Qin, Ruijun Ma, Chaoming Liu, Shuo Zhu, Jun Wang, Huaguo Liang

Design and Verification of an Asynchronous NoC Router Architecture for GALS Systems

M. N. Saranya, Rathnamala Rao

Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations

Victor Champac, Hector Villacorta, R. Gomez-Fuentes, Fabian Vargas, Jaume Segura

Reactant and Waste Minimization during Sample Preparation on Micro-Electrode-Dot-Array Digital Microfluidic Biochips using Splitting Trees

Chen Dong, Xiao Chen, Zhenyi Chen

Analysis of the Lifecycles of Automotive Resistor Lead in Random Vibration

Huang Linsen

Research on the Reliability of Interconnected Solder Joints of Copper Pillars under Random Vibration

Shifeng Yu, Junjie Dai, Junhui Li

• Open Access

Non-Invasive Hardware Trojans Modeling and Insertion: A Formal Verification Approach

Hala Ibrahim, Haytham Azmi, M. Watheq El-Kharashi, Mona Safar