Issue 2/2024
Content (11 Articles)
A Survey and Recent Advances: Machine Intelligence in Electronic Testing
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET
Baojun Liu, Li Cai, Chuang Li
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop Application
Rachana Ahirwar, Manisha Pattanaik, Pankaj Srivastava
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission
Rongxing Cao, Yan Liu, Yulong Cai, Bo Mei, Lin Zhao, Jiayu Tian, Shuai Cui, He Lv, Xianghua Zeng, Yuxiong Xue
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs
Alberto Bosio, Samuele Germiniani, Graziano Pravadelli, Marcello Traiola
- Open Access
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs
Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edwar J. Patiño Núñez, Robert Limas, Matteo Sonza Reorda
Sahand: A Software Fault-Prediction Method Using Autoencoder Neural Network and K-Means Algorithm
Bahman Arasteh, Sahar Golshan, Shiva Shami, Farzad Kiani
- Open Access
A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing
T. S. Copetti, M. Fieback, T. Gemmeke, S. Hamdioui, L. M. Bolzani Poehls
Simulation-based Analysis of RPL Routing Attacks and Their Impact on IoT Network Performance
Raveendranadh Bokka, Tamilselvan Sadasivam
