Journal Journal of Electronic Testing Issue 3/2021 share SHARE Search insite SEARCH Table of Contents (12 Articles) 28-07-2021 Editorial Vishwani D. Agrawal 31-07-2021 Test Technology Newsletter Open Access 30-06-2021 Resistance of the Montgomery Ladder Against Simple SCA: Theory and Practice Ievgen Kabin, Zoya Dyka, Dan Klann, Marcin Aftowicz, Peter Langendoerfer Download PDF-version View full text 18-05-2021 A Secure and Robust PUF-based Key Generation with Wiretap Polar Coset Codes Yonghong Bai, Zhiyuan Yan 19-06-2021 Hardware Trojan Free Netlist Identification: A Clustering Approach Anindan Mondal, Rajesh Kumar Biswal, Mahabub Hasan Mahalat, Suchismita Roy, Bibhash Sen 05-06-2021 Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs Carlos J. González, Bruno L. Costa, Diego N. Machado, Rafael G. Vaz, Alexis C. Vilas Bôas, Odair L. Gonçalez, Helmut Puchner, Fernanda L. Kastensmidt, Nilberto H. Medina, Marcilei A. Guazzelli, Tiago R. Balen 07-07-2021 Measurement and Simulation of the Near Magnetic Field Radiated by Integrated Magnetic Inductors M. I. Boukhari, D. A. Oumar, S. Capraro, D. Pietroy, J. P. Chatelon, J. J. Rousseau 10-07-2021 Spectrum Analyzer Based on a Dynamic Filter S. Herasimov, M. Borysenko, E. Roshchupkin, V. I. Hrabchak, Yu. A. Nastishin 18-08-2021 Analysis and Detection of Open-gate Defects in Redundant Structures of a FinFET SRAM Cell Victor Champac, Javier Mesalles, Hector Villacorta, Fabian Vargas Open Access 01-06-2021 Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Bolzani Poehls, Tiago Balen Download PDF-version View full text 05-07-2021 A Numeral System Based Framework for Improved One-Lambda Crosstalk Avoidance Code Using Recursive Symmetry Formula M. Taali, Z. Shirmohammadi 30-04-2021 Fault Tolerant Lanczos Eigensolver via an Invariant Checking Method Felix Loh, Kewal K. Saluja, Parameswaran Ramanathan