Journal of Electronic Testing

Editorial

Vishwani D. Agrawal

Test Technology Newsletter

• Open Access

Modular Test Kit – A Modular Approach for Efficient and Function-Oriented Testing

Benedikt Jooß, Dieter Schramm

Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations

K. Coulié, H. Aziza, W. Rahajandraibe

Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets

Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan

BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems

Sabyasachi Deyati, Barry Muldrey, Abhijit Chatterjee

A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits

Pradeep Kumar Biswal

A Novel Metaheuristic Based Method for Software Mutation Test Using the Discretized and Modified Forrest Optimization Algorithm

Bahman Arasteh, Farhad Soleimanian Gharehchopogh, Peri Gunes, Farzad Kiani, Mahsa Torkamanian-Afshar

Multi-Objective Optimization Based Test Pattern Generation for Hardware Trojan Detection

Vijaypal Singh Rathor, Deepak Singh, Simranjit Singh, Mohit Sajwan

Incomplete Testing of SOC

Kunwer Mrityunjay Singh, Jatindra Deka, Santosh Biswas