Issue 3/2024
Content (8 Articles)
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach
Esther Goudet, Fabio Sureau, Paul Breuil, Luis Peña Treviño, Lirida Naviner, Jean-Marc Daveau, Philippe Roche
Design and Verification of a SAR ADC SystemVerilog Real Number Model
Nikolaos Georgoulopoulos, Theodora Mamali, Alkis Hatzopoulos
Formal Verification of Universal Numbers using Theorem Proving
Adnan Rashid, Ayesha Gauhar, Osman Hasan, Sa’ed Abed, Imtiaz Ahmad
A Novel Framework For Optimal Test Case Generation and Prioritization Using Ent-LSOA And IMTRNN Techniques
A. Tamizharasi, P. Ezhumalai
Towards the Detection of Hardware Trojans with Cost Effective Test Vectors using Genetic Algorithm
Sandip Chakraborty, Archisman Ghosh, Anindan Mondal, Bibhash Sen
Phase Noise Analysis Performance Improvement, Testing and Stabilization of Microwave Frequency Source
Vipin Kumar, Jayanta Ghosh
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision
Yuqi Pan, Huaguo Liang, Junming Li, Jinxing Qu, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu
