Issue 4/2021
Content (12 Articles)
Review of Manufacturing Process Defects and Their Effects on Memristive Devices
- Open Access
L. M. Bolzani Poehls, M. C. R. Fieback, S. Hoffmann-Eifert, T. Copetti, E. Brum, S. Menzel, S. Hamdioui, T. Gemmeke
Neuro-Fuzzy Evaluation of the Software Reliability Models by Adaptive Neuro Fuzzy Inference System
Milos Milovancevic, Aleksandar Dimov, Kamen Boyanov Spasov, Ljubomir Vračar, Miroslav Planić
Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits
Tsai-Chieh Chen, Chia-Cheng Pai, Yi-Zhan Hsieh, Hsiao-Yin Tseng, James Chien-Mo, Tsung-Te Liu, I-Wei Chiu
SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier
Mahshid Tebyanian, Azadeh Mokhtarpour, Alireza Shafieinejad
Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications
Aibin Yan, Aoran Cao, Zhelong Xu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen
Fault-Aware Dependability Enhancement Techniques for Phase Change Memory
Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase, Chun-Lung Hsu, Chi-Tien Sun
Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability
Hussein Bazzi, Hassen Aziza, Mathieu Moreau, Adnan Harb
Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems
Qi Wang, Yiming Ouyang, Yingchun Lu, Huaguo Liang, Dakai Zhu
HVoC: a Hybrid Model Checking - Interactive Theorem Proving Approach for Functional Verification of Digital Circuits
Mishal Fatima Minhas, Osman Hasan, Sa’ed Abed
