Journal of Electronic Testing 4/2021

11-10-2021

Editorial

Vishwani D. Agrawal

17-09-2021

Test Technology Newsletter

Open Access 21-10-2021

Review of Manufacturing Process Defects and Their Effects on Memristive Devices

L. M. Bolzani Poehls, M. C. R. Fieback, S. Hoffmann-Eifert, T. Copetti, E. Brum, S. Menzel, S. Hamdioui, T. Gemmeke

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28-09-2021

Neuro-Fuzzy Evaluation of the Software Reliability Models by Adaptive Neuro Fuzzy Inference System

Milos Milovancevic, Aleksandar Dimov, Kamen Boyanov Spasov, Ljubomir Vračar, Miroslav Planić

30-09-2021

Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits

Tsai-Chieh Chen, Chia-Cheng Pai, Yi-Zhan Hsieh, Hsiao-Yin Tseng, James Chien-Mo, Tsung-Te Liu, I-Wei Chiu

24-08-2021

SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier

Mahshid Tebyanian, Azadeh Mokhtarpour, Alireza Shafieinejad

25-08-2021

Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications

Aibin Yan, Aoran Cao, Zhelong Xu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen

14-08-2021

Fault-Aware Dependability Enhancement Techniques for Phase Change Memory

Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase, Chun-Lung Hsu, Chi-Tien Sun

11-10-2021

Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability

Hussein Bazzi, Hassen Aziza, Mathieu Moreau, Adnan Harb

03-11-2021

Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers

Marco Grossi, Martin Omaña

18-09-2021

Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems

Qi Wang, Yiming Ouyang, Yingchun Lu, Huaguo Liang, Dakai Zhu

26-06-2021

HVoC: a Hybrid Model Checking - Interactive Theorem Proving Approach for Functional Verification of Digital Circuits

Mishal Fatima Minhas, Osman Hasan, Sa’ed Abed

Springer Professional

Journal of Electronic Testing

Issue 4/2021

Table of Contents (12 Articles)

Editorial

Test Technology Newsletter

Review of Manufacturing Process Defects and Their Effects on Memristive Devices

Neuro-Fuzzy Evaluation of the Software Reliability Models by Adaptive Neuro Fuzzy Inference System

Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits

SC-COTD: Hardware Trojan Detection Based on Sequential/Combinational Testability Features using Ensemble Classifier

Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications

Fault-Aware Dependability Enhancement Techniques for Phase Change Memory

Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability

Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers

Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems

HVoC: a Hybrid Model Checking - Interactive Theorem Proving Approach for Functional Verification of Digital Circuits

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