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Journal of Electronic Testing

Issue 4/2021

Content (12 Articles)

Editorial

Vishwani D. Agrawal

Open Access

Review of Manufacturing Process Defects and Their Effects on Memristive Devices

L. M. Bolzani Poehls, M. C. R. Fieback, S. Hoffmann-Eifert, T. Copetti, E. Brum, S. Menzel, S. Hamdioui, T. Gemmeke

Neuro-Fuzzy Evaluation of the Software Reliability Models by Adaptive Neuro Fuzzy Inference System

Milos Milovancevic, Aleksandar Dimov, Kamen Boyanov Spasov, Ljubomir Vračar, Miroslav Planić

Clock-Less DFT and BIST for Dual-Rail Asynchronous Circuits

Tsai-Chieh Chen, Chia-Cheng Pai, Yi-Zhan Hsieh, Hsiao-Yin Tseng, James Chien-Mo, Tsung-Te Liu, I-Wei Chiu

Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications

Aibin Yan, Aoran Cao, Zhelong Xu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen

Fault-Aware Dependability Enhancement Techniques for Phase Change Memory

Shyue-Kung Lu, Hui-Ping Li, Kohei Miyase, Chun-Lung Hsu, Chi-Tien Sun

Neural Network-based Online Fault Diagnosis in Wireless-NoC Systems

Qi Wang, Yiming Ouyang, Yingchun Lu, Huaguo Liang, Dakai Zhu