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Journal of Electronic Testing

Issue 4/2023

Content (10 Articles)

Editorial

Vishwani D. Agrawal

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems

Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr, Rafael I. Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei A. Guazzelli, Nilberto H. Medina, Paulo F. Butzen

New Second-order Threshold Implementation of Sm4 Block Cipher

Tianyi Shao, Bohua Wei, Yu Ou, Yongzhuang Wei, Xiaonian Wu

Threshold Analysis Using Probabilistic Xgboost Classifier for Hardware Trojan Detection

Tapobrata Dhar, Ranit Das, Chandan Giri, Surajit Kumar Roy