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Journal of Electronic Testing

Issue 6/2022

Content (9 Articles)

Editorial

Vishwani D. Agrawal

Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing Countries

Jean de Dieu Nguimfack-Ndongmo, Kevin Kentsa Zana, Derek Ajesam Asoh, Nicole Adélaïde Kengnou Telem, René Kuate-Fochie, Godpromesse Kenné

  • Open Access

A Complete Design-for-Test Scheme for Reconfigurable Scan Networks

Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich

A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing

Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen