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Journal of Electronic Testing

Theory and Applications

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Journal of Electronic Testing OnlineFirst articles

28-09-2022

Self Healing Controllers to Mitigate SEU in the Control Path of FPGA Based System: A Complete Intrinsic Evolutionary Approach

Single event upsets (SEU) are the transient errors that occur during the operation of the circuit. High radiation in the space environment and its invasion of the nanoelectronics can result in a bit-flip in the combinational circuits and may cause …

23-09-2022

Achieving Agility in Projects Through Hierarchical Divisive Clustering Algorithm

Software products cannot be delivered to the market without proper testing. Only with the help of Testing, accuracy and quality of the product improves. Test personnel cannot compromise on the quality of the product and cannot afford to miss any …

23-09-2022

A Review of Various Defects in PCB

Printed Circuit Boards (PCBs) are the building blocks for all electronic products. Fabrication of a PCB involves various mechanical and chemical processes. As obtaining accuracy in the mechanical and chemical processes is very difficult, various …

10-09-2022

Influence of Printed Circuit Board Dynamics on the Fretting Wear of Electronic Connectors: A Dynamic Analysis Approach

The harsh operating environment of automotive and aerospace applications causes printed circuit board (PCB) connectors to be susceptible to intermittent high contact resistance, which eventually leads to a failure resulting in the loss of signal …

14-11-2015

Editorial

About this journal

The Journal of Electronic Testing, the only journal specifically dedicated to electronic testing, is an international forum disseminating the latest research results and applications in the field. With its rapid submission to publication cycle, the journal quickly brings important findings to the attention of researchers and practitioners.

A partial list of topics covered in the journal includes testing of VLSI devices, printed circuit boards, and electronic systems; fault modeling and simulation; test generation; design for testability; electron beam test systems; formal verification of hardware; simulation for verification; design debugging; economics of testing; quality and reliability; and CAD Tools.

In addition to original research papers, the journal publishes conference papers of exceptional merit. Readers will also find surveys and reviews examining the state of the art in the field.

Metadata
Title
Journal of Electronic Testing
Coverage
Volume 10/1997 - Volume 38/2022
Publisher
Springer US
Electronic ISSN
1573-0727
Print ISSN
0923-8174
Journal ID
10836
DOI
https://doi.org/10.1007/10836.1573-0727