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Journal of Materials Science: Materials in Electronics

Issue 10/2010

Content (20 Articles)

ZrO2 thin films on Si substrate

Yew Hoong Wong, Kuan Yew Cheong

Effect of ZnO buffer layer on AZO film properties and photovoltaic applications

J. H. Shi, S. M. Huang, J. B. Chu, H. B. Zhu, Z. A. Wang, X. D. Li, D. W. Zhang, Z. Sun, W. J. Cheng, F. Q. Huang, X. J. Yin

Kerr modulators based on polymer-dispersed liquid crystal complexes

J. Niziol, R. Węgłowski, S. J. Kłosowicz, A. Majchrowski, P. Rakus, A. Wojciechowski, I. V. Kityk, S. Tkaczyk, E. Gondek

Effect of barrier layer composition and thickness on structural and optical properties of TlInGaAsN/TlGaAs(N) triple quantum wells

Kang Min Kim, Daivasigamani Krishnamurthy, Yuji Sakai, Jong-Uk Seo, Shigehiko Hasegawa, Hajime Asahi

Effects of Al content on the properties of ZnO:Al films prepared by Al2O3 and ZnO co-sputtering

Zhonghua Deng, Changgang Huang, Jiquan Huang, Meili Wang, Hong He, Hai Wang, Yongge Cao

Dielectric and piezoelectric properties of (Bi,Na,Li)TiO3–Ba(Ti,Zr)O3 lead-free ceramics

Yanqiu Huang, Yixiong Liu, Lanfang Gao, Tiantian Liu, Guoxi Zhang

Effects of reflow atmosphere and flux on Sn whisker growth of Sn–Ag–Cu solders

Alongheng Baated, Keun-Soo Kim, Katsuaki Suganuma, Sharon Huang, Benjamin Jurcik, Shigeyoshi Nozawa, Minoru Ueshima

Investigation of the fracture morphologies of Sn3.8Ag0.7Cu joints under high-velocity conditions

Ning Zhang, Yaowu Shi, Fu Guo, Yongpei Lei, Zhidong Xia, Li Tian

Investigation on electrical and microstructural properties of Thick Film Lead-Free resistor series under various firing conditions

Konrad Kiełbasiński, Małgorzata Jakubowska, Anna Młożniak, Marko Hrovat, Janez Holc, Darko Belavič