Issue 4/2003
Content (9 Articles)
Effects of neutron irradiation on SiGe HBT and Si BJT devices
Xiang-Ti Meng, Hong-Wei Yang, Ai-Guo Kang, Ji-Lin Wang, Hong-Yong Jia, Pei-Yi Chen, Pei-Hsin Tsien
Microwave dielectric properties of mixed phase ceramics, Ba(Zn1/3Ta2/3)O3–xCaTiO3 and xMgTiO3–yCaTiO3–z(Nd2O3,wTiO2)
Takahiro Takada, Keisuke Kageyama, Mitsuharu Yonemura, Naoki Hara, Satoshi Takao
Investigation of the crystal structure and electrical properties of La3+-doped SrBi2Ta2O9 ceramics
Jingsong Liu, Shuren Zhang, Chengtao Yang
Characterization of GaN and In x Ga1−x N films grown by MOCVD and MBE on free-standing GaN templates and quantum well structures
K. S. Ramaiah, D. Huang, M. A. Reshchikov, F. Yun, H. Morkoç, J. Jasinski, Z. Liliental-Weber, C. Sone, S. S. Park, K. Y. Lee
Structural roughness and interface strain properties in Si/SiO2/Poly-Si1−x Ge x tri-layer system with ultrathin oxide
L. L. Ye, A. Thölén, A. P. Jacob, T. Myrberg, O. Nur, M. Willander