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Journal of Materials Science: Materials in Electronics

Issue 4/2009

Content (15 Articles)

Micro-porous silicon structure with low optical reflection

Chiung Wei Lin, Yi Liang Chen, Yeong Shyang Lee

Thermal annealing of porous silicon to develop a quasi monocrystalline structure

M. Banerjee, E. Bontempi, S. Bhattacharya, S. Maji, S. Basu, H. Saha

Tolerance factor and the stability discussion of ABO3-type ilmenite

XiangChun Liu, Rongzi Hong, Changsheng Tian

Microstructure studies of ZnO nanoneedles

Yuxi Chen, Bing Qu, Yuri A. Barnakov, Qunli Tang, Jianghua Chen

Effect of silicidation on silicon-based thin film resistors in SiGe integrated circuits

Sang-Heung Lee, Seung-Yun Lee, Chan Woo Park, Dongwoo Suh