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Published in: Journal of Materials Science: Materials in Electronics 6/2017

23-11-2016

Magnetoresistance of nanocomposite copper/carbon thin films

Authors: Ali Arman, Carlos Luna, Mohsen Mardani, Fatemeh Hafezi, Amine Achour, Azin Ahmadpourian

Published in: Journal of Materials Science: Materials in Electronics | Issue 6/2017

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Abstract

Nanocomposite thin films made of partially oxidized Cu nanoparticles embedded into hydrogenated amorphous carbon, with different thicknesses and Cu/C ratio, were prepared by means of radio frequency plasma enhanced chemical vapor deposition and radio frequency sputtering using acetylene gas and copper target. The surface roughness was investigated using atomic force microscopy, revealing the fractal geometry of the Cu/carbon thin films at the nanoscale with fractal dimensions around 2.7. In addition, the electrical properties of these films and their dependence on the application of low magnetic fields were explored at room temperature. It was found that when the Cu nanoparticles are separated by gaps, the electrical conduction is governed by tunneling effects. In these conditions, the samples exhibit negative magnetoresistance values, displaying steps in the dependences on the magnetic field. These properties suggest the potential use of these films as magnetic sensors in spintronics.

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Literature
1.
go back to reference D.C. Licciardello, D.J. Thouless, Conductivity and mobility edges for two-dimensional disordered systems. J. Phys. C: Solid. State Phys. 8(24), 4157–4170 (1975)CrossRef D.C. Licciardello, D.J. Thouless, Conductivity and mobility edges for two-dimensional disordered systems. J. Phys. C: Solid. State Phys. 8(24), 4157–4170 (1975)CrossRef
2.
go back to reference D.J. Thouless, Maximum metallic resistance in thin wires. Phys. Rev. Lett. 39(18), 1167 (1977)CrossRef D.J. Thouless, Maximum metallic resistance in thin wires. Phys. Rev. Lett. 39(18), 1167 (1977)CrossRef
3.
go back to reference D.C. Licciardello, D.J. Thouless, Conductivity and mobility edges in disordered systems. II. Further calculations for the square and diamond lattices. J. Phys. C: Solid State Phys. 11(5), 925–936 (1978)CrossRef D.C. Licciardello, D.J. Thouless, Conductivity and mobility edges in disordered systems. II. Further calculations for the square and diamond lattices. J. Phys. C: Solid State Phys. 11(5), 925–936 (1978)CrossRef
4.
go back to reference E. Abrahams, P.W. Anderson, D.C. Liciardello, T.V. Ramakrishnan, Scaling theory of localization: absence of quantum diffusion in two dimensions. Phys. Rev. Lett. 42(10), 673–676 (1979)CrossRef E. Abrahams, P.W. Anderson, D.C. Liciardello, T.V. Ramakrishnan, Scaling theory of localization: absence of quantum diffusion in two dimensions. Phys. Rev. Lett. 42(10), 673–676 (1979)CrossRef
5.
go back to reference C. Van Haesendonck, L. Van den dries, Y. Bruynseraede, G. Deutscher, Localization and negative magnetoresistance in thin copper films. Phys. Rev. B. 25(8), 5090–5096 (1982)CrossRef C. Van Haesendonck, L. Van den dries, Y. Bruynseraede, G. Deutscher, Localization and negative magnetoresistance in thin copper films. Phys. Rev. B. 25(8), 5090–5096 (1982)CrossRef
6.
go back to reference D. Abraham, R. Rosenbaum, Magnetoresistance of thin copper films. Phys. Rev. B. 27(2), 1413–1416 (1983)CrossRef D. Abraham, R. Rosenbaum, Magnetoresistance of thin copper films. Phys. Rev. B. 27(2), 1413–1416 (1983)CrossRef
7.
go back to reference D. Pesin, A.H. MacDonald, Spintronics and pseudospintronics in graphene and topological insulators. Nat. Mater. 11, 409–416 (2012)CrossRef D. Pesin, A.H. MacDonald, Spintronics and pseudospintronics in graphene and topological insulators. Nat. Mater. 11, 409–416 (2012)CrossRef
8.
go back to reference M. Vazquez, C. Luna, M.P. Morales, R. Sanz, C.J. Serna, C. Mijangos, Magnetic nanoparticles: synthesis, ordering and properties. Phys. B: Condens. Matter 354(1), 71–79 (2004)CrossRef M. Vazquez, C. Luna, M.P. Morales, R. Sanz, C.J. Serna, C. Mijangos, Magnetic nanoparticles: synthesis, ordering and properties. Phys. B: Condens. Matter 354(1), 71–79 (2004)CrossRef
9.
go back to reference C. Luna, M. Ilyn, V. Vega, V.M. Prida, J. González, R. Mendoza-Reséndez, Size distribution and frustrated antiferromagnetic coupling effects on the magnetic behavior of ultrafine akaganéite (ß-FeOOH) nanoparticles. J. Phys. Chem. C 118(36), 21128–21139 (2014)CrossRef C. Luna, M. Ilyn, V. Vega, V.M. Prida, J. González, R. Mendoza-Reséndez, Size distribution and frustrated antiferromagnetic coupling effects on the magnetic behavior of ultrafine akaganéite (ß-FeOOH) nanoparticles. J. Phys. Chem. C 118(36), 21128–21139 (2014)CrossRef
10.
go back to reference S. Naderi, M. Shahrokhi, H.R. Noruzi, A. Gurabi, R. Moradian, Structural, electronic and magnetic properties of Fe and Co monatomic nanochains encapsulated in BN nanotube bundle. Eur. Phys. J. Appl. Phys. 62(03), 30402 (2013)CrossRef S. Naderi, M. Shahrokhi, H.R. Noruzi, A. Gurabi, R. Moradian, Structural, electronic and magnetic properties of Fe and Co monatomic nanochains encapsulated in BN nanotube bundle. Eur. Phys. J. Appl. Phys. 62(03), 30402 (2013)CrossRef
11.
go back to reference T. Ghodselahi, A. Arman, Magnetoresistance of Cu–Ni nanoparticles in hydrogenated amorphous carbon thin films. J. Mater. Sci.: Mater. Electron. 26(6), 4193–4197 (2015) T. Ghodselahi, A. Arman, Magnetoresistance of Cu–Ni nanoparticles in hydrogenated amorphous carbon thin films. J. Mater. Sci.: Mater. Electron. 26(6), 4193–4197 (2015)
12.
go back to reference N. Ghobadi, M. Ganji, C. Luna, A. Arman, A. Ahmadpourian, Effects of substrate temperature on the properties of sputtered TiN thin films. J. Mater. Sci.: Mater. Electron. 27(3), 2800–2808 (2016) N. Ghobadi, M. Ganji, C. Luna, A. Arman, A. Ahmadpourian, Effects of substrate temperature on the properties of sputtered TiN thin films. J. Mater. Sci.: Mater. Electron. 27(3), 2800–2808 (2016)
13.
go back to reference J. Kong, A.M. Cassell, H. Dai, Chemical vapor deposition of methane for single-walled carbon nanotubes. Chem. Phys. Lett. 292(4), 567–574 (1998)CrossRef J. Kong, A.M. Cassell, H. Dai, Chemical vapor deposition of methane for single-walled carbon nanotubes. Chem. Phys. Lett. 292(4), 567–574 (1998)CrossRef
14.
go back to reference M. Molamohammadi, A. Arman, A. Achour, B. Astinchap, A. Ahmadpourian, A. Boochani, S. Naderi, A. Ahmadpourian, Microstructure and optical properties of cobalt–carbon nanocomposites prepared by RF-sputtering. J. Mater. Sci.: Mater. Electron. 26(8), 5964–5969 (2015) M. Molamohammadi, A. Arman, A. Achour, B. Astinchap, A. Ahmadpourian, A. Boochani, S. Naderi, A. Ahmadpourian, Microstructure and optical properties of cobalt–carbon nanocomposites prepared by RF-sputtering. J. Mater. Sci.: Mater. Electron. 26(8), 5964–5969 (2015)
15.
go back to reference T. Ghodselahi, M.A. Vesaghi, A. Gelali, H. Zahrabi, S. Solaymani, Morphology, optical and electrical properties of Cu–Ni nanoparticles in aC:H prepared by co-deposition of RF-sputtering and RF-PECVD. Appl. Surf. Sci. 258(2), 727–731 (2011)CrossRef T. Ghodselahi, M.A. Vesaghi, A. Gelali, H. Zahrabi, S. Solaymani, Morphology, optical and electrical properties of Cu–Ni nanoparticles in aC:H prepared by co-deposition of RF-sputtering and RF-PECVD. Appl. Surf. Sci. 258(2), 727–731 (2011)CrossRef
16.
go back to reference T. Ghodselahi, M.A. Vesaghi, A. Shafiekhani, M. Ahmadi, M. Panahandeh, M. HeidariSaani, Metal–nonmetal transition in the copper–carbon nanocomposite films. Phys. B: Condens. Matter 405(18), 3949–3951 (2010)CrossRef T. Ghodselahi, M.A. Vesaghi, A. Shafiekhani, M. Ahmadi, M. Panahandeh, M. HeidariSaani, Metal–nonmetal transition in the copper–carbon nanocomposite films. Phys. B: Condens. Matter 405(18), 3949–3951 (2010)CrossRef
17.
go back to reference A. Arman, T. Ghodselahi, M. Molamohammadi, S. Solaymani, H. Zahrabi, A. Ahmadpourian, Microstructure and optical properties of Cu@Ni nanoparticles embedded in aC:H. Prot. Met. Phys. Chem. Surf. 51(4), 575–578 (2015)CrossRef A. Arman, T. Ghodselahi, M. Molamohammadi, S. Solaymani, H. Zahrabi, A. Ahmadpourian, Microstructure and optical properties of Cu@Ni nanoparticles embedded in aC:H. Prot. Met. Phys. Chem. Surf. 51(4), 575–578 (2015)CrossRef
18.
go back to reference S. Talu, S. Stach, V. Sueiras, N.M. Ziebarth, Fractal analysis of AFM images of the surface of Bowman’s membrane of the human cornea. Ann. Biomed. Eng. 43(4), 906–916 (2015)CrossRef S. Talu, S. Stach, V. Sueiras, N.M. Ziebarth, Fractal analysis of AFM images of the surface of Bowman’s membrane of the human cornea. Ann. Biomed. Eng. 43(4), 906–916 (2015)CrossRef
19.
go back to reference S. Talu, S. Stach, T. Lainovic, M. Vilotic, L. Blazic, S.F. Alb, D. Kakas, Surface roughness and morphology of dental nanocomposites polished by four different procedures evaluated by a multifractal approach. Appl. Surf. Sci. 330, 20–29 (2015)CrossRef S. Talu, S. Stach, T. Lainovic, M. Vilotic, L. Blazic, S.F. Alb, D. Kakas, Surface roughness and morphology of dental nanocomposites polished by four different procedures evaluated by a multifractal approach. Appl. Surf. Sci. 330, 20–29 (2015)CrossRef
20.
go back to reference S. Talu, A.J. Ghazai, S. Stach, A. Hassan, Z. Hassan, M. Talu, Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0. 08In0. 08Ga0. 84N thin film assessed by atomic force microscopy and fractal analysis. J. Mater. Sci.: Mater. Electron. 25(1), 466–477 (2014) S. Talu, A.J. Ghazai, S. Stach, A. Hassan, Z. Hassan, M. Talu, Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0. 08In0. 08Ga0. 84N thin film assessed by atomic force microscopy and fractal analysis. J. Mater. Sci.: Mater. Electron. 25(1), 466–477 (2014)
21.
go back to reference A. Gelali, A. Ahmadpourian, R. Bavadi, M.R. Hantehzadeh, A. Ahmadpourian, Characterization of microroughness parameters in titanium nitride thin films grown by DC magnetron sputtering. J. Fusion Energy 31(6), 586–590 (2012)CrossRef A. Gelali, A. Ahmadpourian, R. Bavadi, M.R. Hantehzadeh, A. Ahmadpourian, Characterization of microroughness parameters in titanium nitride thin films grown by DC magnetron sputtering. J. Fusion Energy 31(6), 586–590 (2012)CrossRef
22.
go back to reference S. Stach, D. Dallaeva, S. Talu, P. Kaspar, P. Tomanek, S. Giovanzana, L. Grmela, Morphological features in aluminum nitride epilayers prepared by magnetron sputtering. Mater. Sci.-Pol. 33(1), 175–184 (2015) S. Stach, D. Dallaeva, S. Talu, P. Kaspar, P. Tomanek, S. Giovanzana, L. Grmela, Morphological features in aluminum nitride epilayers prepared by magnetron sputtering. Mater. Sci.-Pol. 33(1), 175–184 (2015)
23.
go back to reference A. Arman, Ş. Ţălu, C. Luna, A. Ahmadpourian, M. Naseri, M. Molamohammadi, Micromorphology characterization of copper thin films by AFM and fractal analysis. J. Mater. Sci.: Mater. Electron. 26(12), 9630–9639 (2015) A. Arman, Ş. Ţălu, C. Luna, A. Ahmadpourian, M. Naseri, M. Molamohammadi, Micromorphology characterization of copper thin films by AFM and fractal analysis. J. Mater. Sci.: Mater. Electron. 26(12), 9630–9639 (2015)
24.
go back to reference S. Kulesza, M. Bramowicz, A comparative study of correlation methods for determination of fractal parameters in surface characterization. Appl. Surf. Sci. 293, 196–201 (2014)CrossRef S. Kulesza, M. Bramowicz, A comparative study of correlation methods for determination of fractal parameters in surface characterization. Appl. Surf. Sci. 293, 196–201 (2014)CrossRef
25.
go back to reference T. Ghodselahi, M.A. Vesaghi, A. Shafiekhani, A. Baradaran, A. Karimi, Z. Mobini, Co-deposition process of RF-sputtering and RF-PECVD of copper/carbon nanocomposite films. Surf. Coat. Technol. 202(12), 2731–2736 (2008)CrossRef T. Ghodselahi, M.A. Vesaghi, A. Shafiekhani, A. Baradaran, A. Karimi, Z. Mobini, Co-deposition process of RF-sputtering and RF-PECVD of copper/carbon nanocomposite films. Surf. Coat. Technol. 202(12), 2731–2736 (2008)CrossRef
26.
go back to reference M. Molamohammadi, C. Luna, A. Arman, S. Solaymani, A. Boochani, A. Ahmadpourian, A. Shafiekhani, Preparation and magnetoresistance behavior of nickel nanoparticles embedded in hydrogenated carbon film. J. Mater. Sci.: Mater. Electron. 26(9), 6814–6818 (2015) M. Molamohammadi, C. Luna, A. Arman, S. Solaymani, A. Boochani, A. Ahmadpourian, A. Shafiekhani, Preparation and magnetoresistance behavior of nickel nanoparticles embedded in hydrogenated carbon film. J. Mater. Sci.: Mater. Electron. 26(9), 6814–6818 (2015)
27.
go back to reference D. Dallaeva, S. Talu, S. Stach, P. Skarvada, P. Tomanek, L. Grmela, AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Appl. Surf. Sci. 312, 81–86 (2014)CrossRef D. Dallaeva, S. Talu, S. Stach, P. Skarvada, P. Tomanek, L. Grmela, AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates. Appl. Surf. Sci. 312, 81–86 (2014)CrossRef
Metadata
Title
Magnetoresistance of nanocomposite copper/carbon thin films
Authors
Ali Arman
Carlos Luna
Mohsen Mardani
Fatemeh Hafezi
Amine Achour
Azin Ahmadpourian
Publication date
23-11-2016
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 6/2017
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-016-6113-x

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