New scanning electron microscope
The Westerwald region, especially the town of Höhr-Grenzhausen, has made a name for itself beyond the borders of Europe thanks to its scientific competence in technical ceramics and its excellent training and study opportunities.
The new scanning electron microscope (SEM), a JEOL JSM-7200F from Zeiss, sets new analytical standards for the research of inorganic non-metallic materials. In addition to high-resolution field emission microscopy, the scientific and technological lead is also based on new analytical methods: The Soft X-Ray Emission Spectrometer (SXES) is a powerful spectrometer with high energy resolution. It enables precise elemental analysis with unprecedented resolution for light elements. Element spectra of lithium, boron, carbon, nitrogen and oxygen can be measured and their chemical binding can be analyzed. This is an important milestone not only for the research institution, but also for the region.
Under the leadership of Prof. Dr. rer. nat. Olaf Krause, Vice Dean of the Faculty of Building-Art-Materials at Koblenz University, this project has now been realized in close cooperation with the Research Institute for Inorganic Materials - Glass/Ceramics - GmbH (FGK). This institute, represented by the managing director Dr. Markus Zwick, played a major role in ensuring that a microscope with extraordinary features is now available. This will be used in a long-term cooperation between the university and the FGK in current and future research projects of both institutions.
As part of the research focus "Analytical Imaging", Koblenz University of Applied Sciences is aiming to establish a microanalysis competence centre at the WesterWaldCampus. This is one of eight projects at six universities in Rhineland-Palatinate that are funded by the Carl-Zeiss-Stiftung as part of the "Carl-Zeiss-Stiftung Invest" program.