Issue 1/2009
Content (18 Articles)
General Problems of Metrology and Measurement Technique
The dynamic error of a multichannel measurement system
V. V. Denisenko
Analytic design of monitoring facilities for integrated circuit inspection
A. S. Bondarevskii, F. V. Krekoten
Nanometrology
Measurement of linear dimensions of pattern elements of micro- and nano-structures under high- and low-voltage scanning electron microscopes
Ch. P. Volk, Yu. A. Novikov, A. V. Rakov, P. A. Todua
Modernization of the MAS-1 microscope for use in measurements of the spectra of internal conversion electrons
S. L. Bereznitskii, D. D. Bogachenko, I. V. Gaydaenko, O. K. Egorov, V. V. Kolesnikov, V. F. Turov
Time and Frequency Measurements
Estimation of the errors of query-free measuring instruments used in GLONASS
V. N. Fedotov
Mechanical Measurements
An estimate of the metrological correctness of test-bed checks of a roller reducing gear
O. S. Zharkova
The dependence of the phase transition temperature of Ga–Zn eutectic alloy on its morphology
A. G. Ivanova, S. F. Gerasimov
Electromagnetic Measurements
The checking of generator measuring current transformers in operative commercial electric power metering systems
S. R. Sergeev
Radio Measurements
Ensuring uniformity of measurements in microwave radiometry
E. F. Yurchuk, I. E. Arsaev