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Measurement Techniques

Issue 4/2019

Content (14 Articles)

World Metrology Day – May 20, 2019

The SI – Fundamentally Better (message from the BIPM and BIML Directors)

M. Milton, A. Donnellan

GENERAL PROBLEMS OF METROLOGY AND MEASUREMENT TECHNIQUE

Methods for Rapid Selection of Kernel Function Blur Coefficients in a Nonparametric Pattern Recognition Algorithm

A. V. Lapko, V. A. Lapko

MEASUREMENTS IN INFORMATION TECHNOLOGIES

A Method of Error Correction in Arithmetic Logic Devices of Information-Measuring Systems Processors

A. A. Pavlov, A. N. Tsar’kov, A. V. Dolgovyazov, V. Z. Volkov, D. A. Korsunskii, A. V. Gusev

OPTOPHYSICAL MEASUREMENTS

Estimation of the Error of the Optophysical Method for Measuring the Parameters of an Air Shock Wave

S. I. Gerasimov, A. G. Sirotkina, N. A. Trepalov, R. V. Gerasimova

PHYSICOCHEMICAL MEASUREMENTS

Determination of Rare-Earth Metals in Magnesium Alloys by Atomic Emission Spectrometry with Inductively Coupled Plasma

R. M. Dvoretskov, V. B. Baranovskaya, F. N. Karachevtsev, A. F. Letov