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Published in:
Scope of Technical Diagnostics Read chapter Read first chapter

2013 | OriginalPaper | Chapter

14. Micro-Diagnostics: X-ray and Synchrotron Techniques

Authors : Bernd Randolf Müller, Manfred Paul Hentschel

Published in: Handbook of Technical Diagnostics

Publisher: Springer Berlin Heidelberg

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Abstract

Beyond classical X-ray techniques are used for the purpose of preferably short-term applications, but some supplementary X-ray and synchrotron techniques for higher resolution microdiagnostics take advantage of scattering effects. In contrast to directly imaging methods their resolution is only limited by the diffraction limit of the X-ray wavelength, far below the atomic dimensions. These techniques of scanning topography and refraction synchrotron tomography may permit the systematic diagnostics for finding and exploiting structure/property relations like correlations among atomic, nano and microstructures with macroscopic properties. Their basic advantage over microscopic techniques is their potential for the non-destructive characterisation of materials, far from invasive sample treatments. They combine scattering and spatial resolution.

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Metadata
Title
Micro-Diagnostics: X-ray and Synchrotron Techniques
Authors
Bernd Randolf Müller
Manfred Paul Hentschel
Copyright Year
2013
Publisher
Springer Berlin Heidelberg
Book
Handbook of Technical Diagnostics

Print ISBN: 978-3-642-25849-7

Electronic ISBN: 978-3-642-25850-3

Copyright Year: 2013

DOI
https://doi.org/10.1007/978-3-642-25850-3_14