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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 11/2019

07-05-2019

Microstucture, dielectric properties and impedance analysis of NaBixTi6O12.5+1.5x lead-free ceramics

Authors: Lu Qin, Kanghui Liu, Zhentao Wu, Yike Du, Yong Chen, Xunzhong Shang, Zhang Li

Published in: Journal of Materials Science: Materials in Electronics | Issue 11/2019

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Abstract

Lead-free NaBixTi6O12.5+1.5x ceramics (x = 0.98, 0.99, 1.01, 1.02) with a pseudo-perovskite structure were prepared via the traditional solid-phase reaction. The structure, dielectric properties and impedance spectroscopy of the NaBixTi6O12.5+1.5x ceramics were investigated in detail. X-ray diffraction patterns reveal that all of the prepared ceramics have a single phase and the scanning electron microscope confirms the well-growth performance of the ceramics. The dielectric constant and dielectric loss show great stability with a wide temperature range. It can be learned that the resistance, the maximum Debye peak, and the corresponding capacitance simultaneously decrease with increasing temperature by analysing Z* plots. The active energy of the NaBixTi6O12.5+1.5x ceramics (x = 0.98, 0.99, 1.01, 1.02) are respectively 0.67, 0.56, 1.34 and 1.37 eV, meanwhile, there is no phase transition point in 25–750 °C. The results demonstrate that the electrical properties of the NaBixTi6O12.5+1.5x lead-free ceramics can be well tuned by varying the Bi quantity.
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Metadata
Title
Microstucture, dielectric properties and impedance analysis of NaBixTi6O12.5+1.5x lead-free ceramics
Authors
Lu Qin
Kanghui Liu
Zhentao Wu
Yike Du
Yong Chen
Xunzhong Shang
Zhang Li
Publication date
07-05-2019
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 11/2019
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-019-01425-7

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