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Understanding Ageing Mechanisms Read chapter Read first chapter

2020 | OriginalPaper | Chapter

6. On-Chip Ageing Monitoring and System Adaptation

Authors : Lorena Anghel, Florian Cacho, Riddhi Jitendrakumar Shah

Published in: Ageing of Integrated Circuits

Publisher: Springer International Publishing

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Abstract

Process, voltage, temperature and ageing variations have become important issues in nanometre technology nodes, and thus on-chip accurate reliability and performance monitors have become necessary for adaptive compensation schemes. This chapter presents up-to-date state-of-the-art performance and reliability monitors, insertion methodology and experimental results of different monitors used for process and environment variations as well as ageing compensation. Voltage and frequency scaling techniques are combined with monitors to ensure fault-free operation. Measurements and simulations were performed on large sample sets for varied range of process, voltages, temperatures and ageing to argument on the choice of paths to be monitored and to illustrate adaptive compensation techniques.

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previous chapter Ageing-Aware Logic Synthesis
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Metadata
Title
On-Chip Ageing Monitoring and System Adaptation
Authors
Lorena Anghel
Florian Cacho
Riddhi Jitendrakumar Shah
Copyright Year
2020
Book
Ageing of Integrated Circuits

Print ISBN: 978-3-030-23780-6

Electronic ISBN: 978-3-030-23781-3

Copyright Year: 2020

DOI
https://doi.org/10.1007/978-3-030-23781-3_6