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Journal of Electronic Testing

Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability

  • 11-10-2021
Published in:
Authors
Hussein Bazzi
Hassen Aziza
Mathieu Moreau
Adnan Harb
Published in
Journal of Electronic Testing | Issue 4/2021

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Abstract

The article delves into the performance and stability analysis of a novel 8T1R Non-Volatile SRAM (NVSRAM) design, focusing on its comparison with traditional SRAM and the impact of variability in OxRAM and CMOS technologies. The study introduces a calibrated OxRAM model and leverages Monte Carlo simulations to evaluate the NVSRAM's performance metrics, including energy consumption, switching times, and Static Noise Margins (SNMs). The research highlights the trade-offs between area, energy, and performance, providing valuable insights for ultra-low power applications. The article also compares the proposed NVSRAM design with other NVSRAM architectures, showcasing its advantages in terms of stability and efficiency.
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next article Investigation of the Impact of BTI Aging Phenomenon on Analog Amplifiers
Title
Performances and Stability Analysis of a Novel 8T1R Non-Volatile SRAM (NVSRAM) versus Variability
Authors
Hussein Bazzi
Hassen Aziza
Mathieu Moreau
Adnan Harb
Publication date
11-10-2021
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 4/2021
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-021-05965-x
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