Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 3/2016

11-12-2015

Phase transition, leakage conduction mechanism evolution and enhanced ferroelectric properties in multiferroic Mn-doped BiFeO3 thin films

Authors: Yalong Liu, Jie Wei, Yang Liu, Xiaofei Bai, Peng Shi, Shengchun Mao, Xueqian Zhang, Chen Li, Brahim Dkhil

Published in: Journal of Materials Science: Materials in Electronics | Issue 3/2016

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

Pure and Mn-doped BiFeO3 thin films were prepared by a facile chemical solution deposition process. X-ray diffraction patterns and Raman spectra imply a phase transition from a rhombohedral structure in pure BiFeO3 film to a nearly tetragonal structure in Mn-doped BiFeO3 films. Moreover, it is found that doping of Mn could greatly modify the surface morphology, leakage current properties and ferroelectric properties of BiFeO3 films. Consequently, the lowest leakage current density and the largest remnant polarization are observed in BiFe0.925Mn0.075O3 film which could be well explained by the leakage conduction mechanism and its evolution from the space-charge-limited current behavior for BiFeO3 and BiFe0.95Mn0.05O3 films to the Poole–Frenkel emission for BiFe0.925Mn0.075O3 film, as well as completely an Ohmic behavior for BiFe0.90Mn0.10O3 film. Based on the X-ray photoelectron spectroscopy analysis of Mn ions, we argue that the varied valences of Mn ions such as Mn4+, Mn3+ and Mn2+ may play an important role in lowering leakage current density and enhancing the ferroelectric properties of BiFeO3 films.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
2.
go back to reference J.B. Neaton, C. Ederer, U.V. Waghmare, N.A. Spaldin, K.M. Rabe, Phys. Rev. B 71, 014113 (2005)CrossRef J.B. Neaton, C. Ederer, U.V. Waghmare, N.A. Spaldin, K.M. Rabe, Phys. Rev. B 71, 014113 (2005)CrossRef
3.
go back to reference J. Wang, J.B. Neaton, H. Zheng, V. Nagarajan, S.B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D.G. Schlom, U.V. Waghmare, N.A. Spaldin, K.M. Rabe, M. Wuttig, R. Ramesh, Science 299, 1719 (2003)CrossRef J. Wang, J.B. Neaton, H. Zheng, V. Nagarajan, S.B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D.G. Schlom, U.V. Waghmare, N.A. Spaldin, K.M. Rabe, M. Wuttig, R. Ramesh, Science 299, 1719 (2003)CrossRef
4.
go back to reference J.F. Li, J.L. Wang, M. Wuttig, R. Ramesh, N. Wang, B. Ruette, A.P. Pyatakov, A.K. Zvezdin, D. Viehland, Appl. Phys. Lett. 84, 5261 (2004)CrossRef J.F. Li, J.L. Wang, M. Wuttig, R. Ramesh, N. Wang, B. Ruette, A.P. Pyatakov, A.K. Zvezdin, D. Viehland, Appl. Phys. Lett. 84, 5261 (2004)CrossRef
5.
go back to reference D. Lebeugle, D. Colson, A. Forget, M. Viret, Appl. Phys. Lett. 91, 022907 (2007)CrossRef D. Lebeugle, D. Colson, A. Forget, M. Viret, Appl. Phys. Lett. 91, 022907 (2007)CrossRef
6.
go back to reference S. Iakovlev, C.H. Solterbeck, M. Kuhnke, M. Es-Souni, J. Appl. Phys. 97, 094901 (2005)CrossRef S. Iakovlev, C.H. Solterbeck, M. Kuhnke, M. Es-Souni, J. Appl. Phys. 97, 094901 (2005)CrossRef
7.
go back to reference Y.W. Li, J.L. Sun, J. Chen, X.J. Meng, J.H. Chu, J. Cryst. Growth 285, 595 (2005)CrossRef Y.W. Li, J.L. Sun, J. Chen, X.J. Meng, J.H. Chu, J. Cryst. Growth 285, 595 (2005)CrossRef
8.
go back to reference A.Z. Simões, A.H.M. Gonzalez, L.S. Cavalcante, C.S. Riccardi, E. Longo, J. Appl. Phys. 101, 074108 (2007)CrossRef A.Z. Simões, A.H.M. Gonzalez, L.S. Cavalcante, C.S. Riccardi, E. Longo, J. Appl. Phys. 101, 074108 (2007)CrossRef
9.
go back to reference N.M. Murari, A. Kumar, R. Thomas, R.S. Katiyar, Appl. Phys. Lett. 92, 132904 (2008)CrossRef N.M. Murari, A. Kumar, R. Thomas, R.S. Katiyar, Appl. Phys. Lett. 92, 132904 (2008)CrossRef
10.
11.
go back to reference J. Liu, M.Y. Li, L. Pei, B.F. Yu, D.Y. Guo, X.Z. Zhao, J. Phys. D Appl. Phys. 42, 115409 (2009)CrossRef J. Liu, M.Y. Li, L. Pei, B.F. Yu, D.Y. Guo, X.Z. Zhao, J. Phys. D Appl. Phys. 42, 115409 (2009)CrossRef
12.
go back to reference J. Wu, J. Wang, D. Xiao, J. Zhu, A.C.S. Appl, Mater. Interfaces 3, 2504 (2011)CrossRef J. Wu, J. Wang, D. Xiao, J. Zhu, A.C.S. Appl, Mater. Interfaces 3, 2504 (2011)CrossRef
13.
14.
go back to reference E.M. Choi, A. Kursumovic, O.J. Lee, J.E. Kleibeuker, A. Chen, W. Zhang, W.J.L. MacManus-Driscoll, ACS Appl. Mater. Interface 6, 14836 (2014)CrossRef E.M. Choi, A. Kursumovic, O.J. Lee, J.E. Kleibeuker, A. Chen, W. Zhang, W.J.L. MacManus-Driscoll, ACS Appl. Mater. Interface 6, 14836 (2014)CrossRef
15.
go back to reference D. Kothari, V.R. Reddy, A. Gupta, D.M. Phase, N. Lakshmi, S.K. Deshpande, A.M. Awasthi, J. Phys.: Condens. Matter 19, 136202 (2007) D. Kothari, V.R. Reddy, A. Gupta, D.M. Phase, N. Lakshmi, S.K. Deshpande, A.M. Awasthi, J. Phys.: Condens. Matter 19, 136202 (2007)
16.
go back to reference T. Kawae, Y. Teraguchi, M. Kumeda, A. Morimoto, Appl. Phys. Lett. 94, 112904 (2009)CrossRef T. Kawae, Y. Teraguchi, M. Kumeda, A. Morimoto, Appl. Phys. Lett. 94, 112904 (2009)CrossRef
19.
go back to reference D. Ricinschi, K.Y. Yun, M. Okuyama, J. Phys.: Condens. Matter. 18, L97 (2006) D. Ricinschi, K.Y. Yun, M. Okuyama, J. Phys.: Condens. Matter. 18, L97 (2006)
20.
go back to reference M.N. Iliev, M.V. Abrashev, D. Mazumdar, V. Shelke, A. Gupta, Phys. Rev. B. 82, 014107 (2010)CrossRef M.N. Iliev, M.V. Abrashev, D. Mazumdar, V. Shelke, A. Gupta, Phys. Rev. B. 82, 014107 (2010)CrossRef
21.
go back to reference D. Mazumdar, V. Shelke, M. Iliev, S. Jesse, A. Kumar, S.V. Kalinin, A. Gupta, Nano Lett. 10, 2555 (2010)CrossRef D. Mazumdar, V. Shelke, M. Iliev, S. Jesse, A. Kumar, S.V. Kalinin, A. Gupta, Nano Lett. 10, 2555 (2010)CrossRef
22.
23.
go back to reference M.H. Lee, J.S. Park, D.J. Kim, H.J. Cho, Y.S. Sung, M.H. Kim, T.K. Song, Current. Appl. Phys. 11, S189 (2011) M.H. Lee, J.S. Park, D.J. Kim, H.J. Cho, Y.S. Sung, M.H. Kim, T.K. Song, Current. Appl. Phys. 11, S189 (2011)
25.
go back to reference W. Liu, G. Tan, G. Dong, X. Yan, W. Ye, H. Ren, A. Xia, J. Mater. Sci.: Mater. Electron. 25, 723 (2014) W. Liu, G. Tan, G. Dong, X. Yan, W. Ye, H. Ren, A. Xia, J. Mater. Sci.: Mater. Electron. 25, 723 (2014)
26.
go back to reference H. Yang, M. Jain, N.A. Suvorova, H. Zhou, H.M. Luo, D.M. Feldmann, Q.X. Jia, Appl. Phys. Lett. 91, 072911 (2007)CrossRef H. Yang, M. Jain, N.A. Suvorova, H. Zhou, H.M. Luo, D.M. Feldmann, Q.X. Jia, Appl. Phys. Lett. 91, 072911 (2007)CrossRef
27.
go back to reference G.W. Pabst, L.W. Martin, Y.H. Chu, R. Ramesh, Appl. Phys. Lett. 90, 072902 (2007)CrossRef G.W. Pabst, L.W. Martin, Y.H. Chu, R. Ramesh, Appl. Phys. Lett. 90, 072902 (2007)CrossRef
28.
30.
31.
go back to reference M.C. Biesinger, B.P. Payne, A.P. Grosvenor, L.W.M. Lau, A.R. Gerson, R.S.C. Smart, Appl. Surf. Sci. 257, 2717 (2011)CrossRef M.C. Biesinger, B.P. Payne, A.P. Grosvenor, L.W.M. Lau, A.R. Gerson, R.S.C. Smart, Appl. Surf. Sci. 257, 2717 (2011)CrossRef
32.
go back to reference X.D. Qi, J. Dho, R. Tomov, M.G. Blamire, J.L. MacManus-Driscoll, Appl. Phys. Lett. 86, 062903 (2005)CrossRef X.D. Qi, J. Dho, R. Tomov, M.G. Blamire, J.L. MacManus-Driscoll, Appl. Phys. Lett. 86, 062903 (2005)CrossRef
Metadata
Title
Phase transition, leakage conduction mechanism evolution and enhanced ferroelectric properties in multiferroic Mn-doped BiFeO3 thin films
Authors
Yalong Liu
Jie Wei
Yang Liu
Xiaofei Bai
Peng Shi
Shengchun Mao
Xueqian Zhang
Chen Li
Brahim Dkhil
Publication date
11-12-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 3/2016
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-4135-4

Other articles of this Issue 3/2016

Journal of Materials Science: Materials in Electronics 3/2016 Go to the issue