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Journal of Electronic Materials

Photodetection and Thermistor Applications of Cu-Cd-S Thin Film

  • 01-03-2025
  • Original Research Article
Published in:
Authors
Adebowale Clement Adebisi
Ezekiel Omotoso
Allen Abiodun Olorunkosebi
Marcus Adebola Eleruja
Bolutife Olofinjana
Published in
Journal of Electronic Materials | Issue 5/2025

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Abstract

The study investigates the photodetection and thermistor applications of Cu-Cd-S thin films, a ternary metal chalcogenide with unique physical properties. The research focuses on the preparation of the material using a single-solid-source precursor and the characterization of the thin film through SEM, EDX, and XRD analysis. The Cu-Cd-S thin film exhibits promising photoresistance properties, with a direct bandgap of 2.31 eV, enabling efficient photon absorption and charge carrier generation. Additionally, the film demonstrates positive temperature coefficient (PTC) thermistor characteristics, with a high sensitivity of 0.07119 Ω/K, making it suitable for temperature regulation and overcurrent detection. The study highlights the potential of Cu-Cd-S thin films in various optoelectronic and temperature-sensing applications, while also noting the need for further optimization for long-term reliability.
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Title
Photodetection and Thermistor Applications of Cu-Cd-S Thin Film
Authors
Adebowale Clement Adebisi
Ezekiel Omotoso
Allen Abiodun Olorunkosebi
Marcus Adebola Eleruja
Bolutife Olofinjana
Publication date
01-03-2025
Publisher
Springer US
Published in
Journal of Electronic Materials / Issue 5/2025
Print ISSN: 0361-5235
Electronic ISSN: 1543-186X
DOI
https://doi.org/10.1007/s11664-025-11829-3
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